Study of the structural and optical properties of CuAlxIn1-xTe2 thin film

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Abstract
CuAlxIn1-xTe2 thin films were evaporation on glass substrate using thermal evaporation technique at the thickness (400) nm. X-ray diffraction (XRD) pattern of these films found out that the films have good crystalline structures with tetragonal phase and the degree of the crystalline increases with the increase in the ratio from (0.3-1). Where AFM show that the grain size increase from (85.21-99.40) nm and the roughness increase from (1.62-10.3) nm. The optical properties, absorption, transmission, reflection, and optical constant as a function of In ratio show that the direct energy gap decrease from (2.1-1.71) eV by the increase of the In ratio.