X-band power characterisation of AlInN/AlN/GaN HEMT grown on SiC substrate
Authors:
- 8 November 2007
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 43 (23) , 1317-1318
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- RF Power Measurements of InAlN/GaN Unstrained HEMTs on SiC Substrates at 10 GHzIEEE Electron Device Letters, 2007
- High electron mobility lattice-matched AlInN∕GaN field-effect transistor heterostructuresApplied Physics Letters, 2006
- UNSTRAINED InAlN/GaN HEMT STRUCTUREInternational Journal of High Speed Electronics and Systems, 2004
- 30-W/mm GaN HEMTs by Field Plate OptimizationIEEE Electron Device Letters, 2004
- Power electronics on InAlN/(In)GaN: Prospect for a record performanceIEEE Electron Device Letters, 2001