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Towards manufacturing a 10nm node device with complementary EUV lithography
Home
Publications
Towards manufacturing a 10nm node device with complementary EUV lithography
Towards manufacturing a 10nm node device with complementary EUV lithography
Authors:
JH
Jan V. Hermans
Jan V. Hermans
HD
Huixiong Dai
Huixiong Dai
AN
Ardavan Niroomand
Ardavan Niroomand
DL
David Laidler
David Laidler
MM
Ming Mao
Ming Mao
YC
Yongmei Chen
Yongmei Chen
PL
Philippe Leray
Philippe Leray
CN
Chris Ngai
Chris Ngai
SC
Shaunee Cheng
Shaunee Cheng
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1 April 2013
conference paper
Published by
SPIE-Intl Soc Optical Eng
Vol. 8679
,
86791K-86791K-13
DOI:
10.1117/12.2012136
Abstract
No abstract available
Keywords
DOUBLE PATTERNING TECHNOLOGY
EXTREME ULTRAVIOLET
EXTREME ULTRAVIOLET LITHOGRAPHY
MANUFACTURING
PHOTONS
RETICLES
Cited
Cited by 5 articles
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