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Highly Uniform Epitaxial SiC-Layers Grown in a Hot-Wall CVD Reactor with Mechanical Rotation
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Highly Uniform Epitaxial SiC-Layers Grown in a Hot-Wall CVD Reactor with Mechanical Rotation
Highly Uniform Epitaxial SiC-Layers Grown in a Hot-Wall CVD Reactor with Mechanical Rotation
Authors:
AS
Adolf Schöner
Adolf Schöner
AK
Andrey O. Konstantinov
Andrey O. Konstantinov
SK
S. Karlsson
S. Karlsson
RB
R. Berge
R. Berge
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1 April 2002
journal article
Published by
Trans Tech Publications, Ltd.
in
Materials Science Forum
Vol. 389-393
,
187-190
DOI:
10.4028/www.scientific.net/msf.389-393.187
Abstract
No abstract available
Keywords
CAPACITANCE-VOLTAGE MEASUREMENT
CHEMICAL VAPOR DEPOSITION (CVD)
DOPING UNIFORMITY
EPITAXIAL GROWTH WITH SUBSTRATE ROTATION
THICKNESS UNIFORMITY
WAFER MAPPING
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