X-ray backlighting for the National Ignition Facility (invited)

Authors:
Publisher website
Google Scholar
Abstract
X-ray backlighting is a powerful tool for diagnosing a large variety of high-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to National Ignition Facility scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point-projection technique, pinhole and slit arrays, distributed polychromatic sources, and picket-fence backlighters. In parallel, there have been developments in improving the data signal-to-noise and, hence, quality by switching from film to charge-coupled-device-based recording media and by removing the fixed-pattern noise of microchannel-plate-based cameras.

This publication has 57 references indexed in Scilit: