Dynamic-mode AFM using the piezoelectric cantilever: investigations of local optical and electrical properties
Authors:
- N. SatohNSN. Satoh
- K. KobayashiKKK. Kobayashi
- S. WatanabeSWS. Watanabe
- T. FujiiTFT. Fujii
- T. HoriuchiTHT. Horiuchi
- H. YamadaHYH. Yamada
- K. MatsushigeKMK. Matsushige
- 1 March 2002
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 188 (3-4) , 425-429
Abstract
No abstract availableFunding Information
- Ministry of Education, Culture, Sports, Science and Technology
This publication has 23 references indexed in Scilit:
- Shear force scanning near-field optical microscope based on a piezoelectric bimorph cantileverReview of Scientific Instruments, 2001
- Two-Dimensional Polymers Investigated by Scanning Near-Field Optical Microscopy: Phase Separation of Polymer Blend MonolayerThe Journal of Physical Chemistry B, 2001
- Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force MicroscopyJapanese Journal of Applied Physics, 2000
- Phase-Separation Structure of a Monolayer of Binary Polymer Blend Studied by Fluorescence Scanning Near-Field Optical MicroscopyThe Journal of Physical Chemistry B, 1999
- Surface potential of ferroelectric thin films investigated by scanning probe microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1999
- Scanning Nonlinear Dielectric Microscopy with Contact Sensing Mechanism for Observation of Nanometer Sized Ferroelectric DomainsJapanese Journal of Applied Physics, 1999
- Nanoscale patterning of an organosilane monolayer on the basis of tip-induced electrochemistry in atomic force microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1996
- Feedback positioning cantilever using lead zirconate titanate thin film for force microscopy observation of micropatternApplied Physics Letters, 1996
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991