The influence of surface roughness on the adhesion force
Authors:
- 11 August 2004
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 36 (8) , 694-697
Abstract
Adhesion measurements are presented which were carried out with an atomic force microscope between polymer balls attached to a cantilever and a silicon wafer under ultra high vacuum conditions. In using a silicon surface with a defined structure a correlation between adhesion force and contact area was found. This correlation could partly be explained by the Johnson–Kendall–Roberts model, if a change of the surface energy is assumed as a result of the structuring. For a constant geometric contact area an additional structuring leads to a decrease of the adhesion force. Copyright © 2004 John Wiley & Sons, Ltd.Keywords
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