Magnetic resonance force microscopy with matching frequencies of cantilever and spin
- 28 January 2022
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 131 (4) , 044301
Abstract
We have studied theoretically magnetic resonance force microscopy with a high-frequency nanomechanical cantilever when the cantilever frequency matches the resonant frequency of a single electron spin. Our analysis shows that in this situation, there is a small probability that the cantilever will oscillate with a large frequency shift. This can open new experimental opportunities for increasing the sensitivity in the detection of a single electron spin or even a single nuclear spin by using a high-frequency cantilever.Keywords
All Related Versions
This publication has 10 references indexed in Scilit:
- Mechanical Generation of Radio-Frequency Fields in Nuclear-Magnetic-Resonance Force MicroscopyPhysical Review Applied, 2017
- Bridging the gap between the Jaynes–Cummings and Rabi models using an intermediate rotating wave approximationPhysics Letters A, 2015
- Tuning the Magnetic Properties of NanoparticlesInternational Journal of Molecular Sciences, 2013
- Evaluation of length-scale effects for mechanical behaviour of micro- and nanocantilevers: I. Experimental determination of length-scale factorsJournal of Physics D: Applied Physics, 2011
- Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applicationsNature Nanotechnology, 2007
- Single spin detection by magnetic resonance force microscopyNature, 2004
- Detection and Manipulation of Statistical Polarization in Small Spin EnsemblesPhysical Review Letters, 2003
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Quantum theory of electromagnetic fields interacting with atoms and moleculesPhysics Reports, 1973
- Comparison of quantum and semiclassical radiation theories with application to the beam maserProceedings of the IEEE, 1963