A method for MOSFET parameter extraction at very low temperature
Authors:
- Gerard GhibaudoGGGerard Ghibaudo
- Francis BalestraFBFrancis Balestra
- 1 March 1989
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 32 (3) , 221-223
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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