Soft Error Mitigation Using Transmission Gate With Varying Gate and Body Bias
- 10 November 2015
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test
- Vol. 34 (1) , 47-56
Abstract
Soft errors not only are major threats to SRAM, but also have become a major threat to the reliability of logic circuits. This article proposes a new transmission-gate approach to filter out soft errors, and it is more efficient when to the thanks to its to compared state of art solutions, capability adjust gate and body bias voltages.Keywords
Funding Information
- Lamar University Research Enhancement Grant (420224)
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