Automated Identification of Thermal Transitions in Conjugated Material Thin Films Using In Situ Optical Spectroscopy

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Abstract
The thermal transitions of organic semiconductors have important implications for morphological and thermomechanical properties of electronic devices. Here we show that in situ UV–vis spectroscopy coupled with automated data analysis is a facile tool to determine the numerous thermal transitions that can exist in organic semiconductor thin films. Thermal transitions are automatically identified through employing linear segment detection of the semilogarithmic normalized deviation metric (NDM) as well as the spectral changes using piecewise linear regression. Furthermore, by comparing the in situ UV–vis with other thermal measurement methods we observe the temperature dependent absorbance can be used to discern the type of thermal transitions including liquid crystal transitions, glass transitions, and melting temperatures. This approach is used to characterize five well‐known conjugated polymers and a small molecule semiconductor, each with distinct thermal phase behavior, where we show good agreement with other thermal characterization methods. Thus, the method we introduce, which we refer to as A utomated T hermal transition identification using L inear regression analysis of the A bsorbance S pectra (ATLAS), is shown to be an effective and simple screening tool to identify multiple thermal transitions in thin films. This is a high‐throughput thermal analysis approach that will assist in advancing structure‐morphology‐function relations in organic electronics.

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