A nanometre-scale mechanical electrometer
Authors:
- A. N. ClelandACA. N. Cleland
- 1 March 1998
- journal article
- letter
- Published by Springer Nature in Nature
- Vol. 392 (6672) , 160-162
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Scanning Single-Electron Transistor Microscopy: Imaging Individual ChargesScience, 1997
- Fabrication of high frequency nanometer scale mechanical resonators from bulk Si crystalsApplied Physics Letters, 1996
- Theory of amplifier-noise evasion in an oscillator employing a nonlinear resonatorPhysical Review A, 1995
- Evading amplifier noise in nonlinear oscillatorsPhysical Review Letters, 1994
- Very low noise photodetector based on the single electron transistorApplied Physics Letters, 1992
- Noise in the Coulomb blockade electrometerApplied Physics Letters, 1992
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Observation of single charge carriers by force microscopyPhysical Review Letters, 1990
- Electrons at Disordered Surfaces andNoisePhysical Review Letters, 1986
- Very low noise cooled audiofrequency preamplifier for gravitational researchReview of Scientific Instruments, 1981