Using history information to improve design flaws detection
Authors:
- D. RatiuDRD. Ratiu
- S. DucasseSDS. Ducasse
- T. GirbaTGT. Girba
- R. MarinescuRMR. Marinescu
- 10 June 2004
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 223-232
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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