Long-term degradation mechanisms of mid-power LEDs for lighting applications
Authors:
- M. BuffoloMBM. Buffolo
- C. De SantiC. De Santi
- M. MeneghiniM. Meneghini
- D. RigonDRD. Rigon
- G. MeneghessoGMG. Meneghesso
- E. ZanoniEZE. Zanoni
- 1 August 2015
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 55 (9-10) , 1754-1758
Abstract
No abstract availableKeywords
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