Rankings
Publications
Search Publications
Cited-by Search
Sources
Publishers
Scholars
Scholars
Top Cited Scholars
Organizations
About
Scilit
About Us
Advisory Board
Data Sources
Career
Support / Contact
User Guide
Publisher User
Search Function
Rankings Function
API Resource
Scilit Knowledge
Metrics
Scilit Recognitions
Publications Classification
Media
News
Blog
Login
Register
Home
Publications
Dependence of electromigration-induced failure lifetimes on NiFe thin-film thickness in giant magnetoresistive spin-valve read heads
Publication with shared reference
10.1063/1.1421644
Home
Publications
Dependence of electromigration-induced failure lifetimes on NiFe thin-film thickness in giant magnetoresistive spin-valve read heads
Publication with shared reference
10.1063/1.1421644
Publications with shared reference:
Dependence of electromigration-induced failure lifetimes on NiFe thin-film thickness in giant magnetoresistive spin-valve read heads
0
publications found
Export
Export
Analytics view
Analytics view
Scroll to top