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  3. Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
  4. Publication with shared reference
  5. 10.1109/t-c.1973.223600
  1. Home
  2. Publications
  3. Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
  4. Publication with shared reference
  5. 10.1109/t-c.1973.223600

Publications with shared reference:

Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic

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