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High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous SiO2and the Si-SiO2Interface
Publication with shared reference
10.1103/physrevlett.43.1683
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High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous SiO2and the Si-SiO2Interface
Publication with shared reference
10.1103/physrevlett.43.1683
Publications with shared reference:
High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous Si
O
2
and the Si-Si
O
2
Interface
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