Rankings
Publications
Search Publications
Cited-by Search
Sources
Publishers
Scholars
Scholars
Top Cited Scholars
Organizations
About
Scilit
About Us
Advisory Board
Data Sources
Career
Support / Contact
User Guide
Publisher User
Search Function
Rankings Function
API Resource
Scilit Knowledge
Metrics
Scilit Recognitions
Publications Classification
Media
News
Blog
Login
Register
Home
Publications
In situX-ray topographic study of the dislocation mobility in high-purity and impurity-doped silicon crystals
Publication with shared reference
10.1080/01418618308245248
Home
Publications
In situX-ray topographic study of the dislocation mobility in high-purity and impurity-doped silicon crystals
Publication with shared reference
10.1080/01418618308245248
Publications with shared reference:
In situ
X-ray topographic study of the dislocation mobility in high-purity and impurity-doped silicon crystals
0
publications found
Export
Export
Analytics view
Analytics view
Scroll to top