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A TEM fresnel diffraction-based method for characterizing thin grain-boundary and interfacial films
Publication with shared reference
10.1080/01418618608244026
Home
Publications
A TEM fresnel diffraction-based method for characterizing thin grain-boundary and interfacial films
Publication with shared reference
10.1080/01418618608244026
Publications with shared reference:
A TEM fresnel diffraction-based method for characterizing thin grain-boundary and interfacial films
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