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  3. Characterization of reactive ion etching-induced damage to n-GaN surfaces using schottky diodes
  4. Publication with shared reference
  5. 10.1007/s11664-997-0162-0
  1. Home
  2. Publications
  3. Characterization of reactive ion etching-induced damage to n-GaN surfaces using schottky diodes
  4. Publication with shared reference
  5. 10.1007/s11664-997-0162-0

Publications with shared reference:

Characterization of reactive ion etching-induced damage to n-GaN surfaces using schottky diodes

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