Alexander L. Roytburd
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Alexander L. Roytburd has a total of 47 co-authors. Here are the top co-authors by number of shared publications:
R. Ramesh
Department of Materials Science and Engineering, University of Maryland, College Park, MD 20742 (USA)
10 shared publications- Valanoor Nagarajan
UNSW Sydney
6 shared publications C. S. Ganpule
Materials Science Research and Engineering Center, University of Maryland, College Park, Maryland 20742
5 shared publicationsE. D. Williams
Materials Science Research and Engineering Center, University of Maryland, College Park, Maryland 20742
5 shared publications- Jun Ouyang
Department of Physics, Seton Hall University, South Orange, NJ 07079, USA
5 shared publications - S. Pamir Alpay
Department of Materials Science and Engineering and Institute of Materials Science
5 shared publications
Latest Publications
- 15 December 2011
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 24 (2) , 024215
Electrical domain morphologies in compositionally graded ferroelectric films
We present a nonlinear thermodynamic formalism coupled with an electrostatic analysis of uniaxial n-layered compositionally graded heteroepitaxial ferroelectric films and extend this formalism to continuously graded ferroelectric films. We show that the domain morphology and its subsequent evolution in the presence of an electric field are determined by the spontaneous polarisation of the film induced through the compositional grading. The results for compositionally graded epitaxial (001) (Ba,Sr)TiO(3) and (001) Pb(Zr,Ti)O(3) films on (001)SrTiO(3) demonstrate that, while the domain morphologies in these two films are different in appearance, the dielectric displacement and the dielectric permittivity of such graded ferroelectric films exhibit a strong nonlinear behaviour which results in a high dielectric tunability. These findings indicate that it is possible to design specific domain structures that will yield desirable dielectric properties by controlling the strength of the compositional grading in the films.
- 15 December 2011
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 24 (2) , 024215
Electrical domain morphologies in compositionally graded ferroelectric films
We present a nonlinear thermodynamic formalism coupled with an electrostatic analysis of uniaxial n-layered compositionally graded heteroepitaxial ferroelectric films and extend this formalism to continuously graded ferroelectric films. We show that the domain morphology and its subsequent evolution in the presence of an electric field are determined by the spontaneous polarisation of the film induced through the compositional grading. The results for compositionally graded epitaxial (001) (Ba,Sr)TiO(3) and (001) Pb(Zr,Ti)O(3) films on (001)SrTiO(3) demonstrate that, while the domain morphologies in these two films are different in appearance, the dielectric displacement and the dielectric permittivity of such graded ferroelectric films exhibit a strong nonlinear behaviour which results in a high dielectric tunability. These findings indicate that it is possible to design specific domain structures that will yield desirable dielectric properties by controlling the strength of the compositional grading in the films.
- 28 October 2011
- Published by Springer Nature in MRS Proceedings
- Vol. 1369
Elastic Heterophase Domains in Ferroelectric Epitaxial Films
- 28 October 2011
- Published by Springer Nature in MRS Proceedings
- Vol. 1369
Elastic Heterophase Domains in Ferroelectric Epitaxial Films
- 20 May 2008
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
- Vol. 55 (5) , 963-970
Phase field modeling of domain structures in ferroelectric thin films
Phase-field simulations were used to explore the effect of the characteristics of the Landau-Devonshire free energy and values of electrostatic and elastic interactions on the formation of different types of domain structures in ferroelectric thin films. Simulations were performed at different constant-applied electric fields and by using a cyclic continuously changing field. It is shown that the 180deg or 90deg domain structures can be produced depending on the relative strength of elastic interactions and the ratio of barrier heights that determine the energy of the 180deg and 90deg domain boundaries. It is shown that the applied field strength and the thickness of the dead layer can play a minor role in the transition between the 90deg and 180deg domain structures. It is also demonstrated that the poling history can affect the type of the domain structure.
- 20 May 2008
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
- Vol. 55 (5) , 963-970
Phase field modeling of domain structures in ferroelectric thin films
Phase-field simulations were used to explore the effect of the characteristics of the Landau-Devonshire free energy and values of electrostatic and elastic interactions on the formation of different types of domain structures in ferroelectric thin films. Simulations were performed at different constant-applied electric fields and by using a cyclic continuously changing field. It is shown that the 180deg or 90deg domain structures can be produced depending on the relative strength of elastic interactions and the ratio of barrier heights that determine the energy of the 180deg and 90deg domain boundaries. It is shown that the applied field strength and the thickness of the dead layer can play a minor role in the transition between the 90deg and 180deg domain structures. It is also demonstrated that the poling history can affect the type of the domain structure.
- 28 February 2008
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 100 (8) , 087602
Phase-Field Modeling of Domain Structure of Confined Nanoferroelectrics
The results of phase-field simulation of domain structures (DSs) in ferroelectric nanorods of different shapes and sizes are presented. It is shown that equilibrium DSs consist of an electrostatically compatible circuit of 180° and 90° domains. A DS in a thin rod contains 90° cubic elastic domains. The trend to minimize the residual stress and the stray field results in the formation of crater-shaped sets of closed circuits of 90° domains, which can be mechanically incompatible but able to maintain electrostatic compatibility during the evolution under an applied electric field.
- 28 February 2008
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 100 (8) , 087602
Phase-Field Modeling of Domain Structure of Confined Nanoferroelectrics
The results of phase-field simulation of domain structures (DSs) in ferroelectric nanorods of different shapes and sizes are presented. It is shown that equilibrium DSs consist of an electrostatically compatible circuit of 180° and 90° domains. A DS in a thin rod contains 90° cubic elastic domains. The trend to minimize the residual stress and the stray field results in the formation of crater-shaped sets of closed circuits of 90° domains, which can be mechanically incompatible but able to maintain electrostatic compatibility during the evolution under an applied electric field.
- 2 August 2007
- Published by Wiley in Advanced Functional Materials
- Vol. 17 (13) , 2094-2100
Engineering of Self‐Assembled Domain Architectures with Ultra‐high Piezoelectric Response in Epitaxial Ferroelectric Films
Substrate clamping and inter‐domain pinning limit movement of non‐180° domain walls in ferroelectric epitaxial films thereby reducing the resulting piezoelectric response of ferroelectric layers. Our theoretical calculations and experimental studies of the epitaxial PbZrxTi1–xO3 films grown on single crystal SrTiO3 demonstrate that for film compositions near the morphotropic phase boundary it is possible to obtain mobile two‐domain architectures by selecting the appropriate substrate orientation. Transmission electron microscopy, X‐ray diffraction analysis, and piezoelectric force microscopy revealed that the PbZr0.52Ti0.48O3 films grown on (101) SrTiO3 substrates feature self‐assembled two‐domain structures, consisting of two tetragonal domain variants. For these films, the low‐field piezoelectric coefficient measured in the direction normal to the film surface (d33) is 200 pm V–1, which agrees well with the theoretical predictions. Under external AC electric fields of about 30 kV cm–1, the (101) films exhibit reversible longitudinal strains as high as 0.35 %, which correspond to the effective piezoelectric coefficients in the order of 1000 pm V–1 and can be explained by elastic softening of the PbZrxTi1–xO3 ferroelectrics near the morphotropic phase boundary.
- 2 August 2007
- Published by Wiley in Advanced Functional Materials
- Vol. 17 (13) , 2094-2100
Engineering of Self‐Assembled Domain Architectures with Ultra‐high Piezoelectric Response in Epitaxial Ferroelectric Films
Substrate clamping and inter‐domain pinning limit movement of non‐180° domain walls in ferroelectric epitaxial films thereby reducing the resulting piezoelectric response of ferroelectric layers. Our theoretical calculations and experimental studies of the epitaxial PbZrxTi1–xO3 films grown on single crystal SrTiO3 demonstrate that for film compositions near the morphotropic phase boundary it is possible to obtain mobile two‐domain architectures by selecting the appropriate substrate orientation. Transmission electron microscopy, X‐ray diffraction analysis, and piezoelectric force microscopy revealed that the PbZr0.52Ti0.48O3 films grown on (101) SrTiO3 substrates feature self‐assembled two‐domain structures, consisting of two tetragonal domain variants. For these films, the low‐field piezoelectric coefficient measured in the direction normal to the film surface (d33) is 200 pm V–1, which agrees well with the theoretical predictions. Under external AC electric fields of about 30 kV cm–1, the (101) films exhibit reversible longitudinal strains as high as 0.35 %, which correspond to the effective piezoelectric coefficients in the order of 1000 pm V–1 and can be explained by elastic softening of the PbZrxTi1–xO3 ferroelectrics near the morphotropic phase boundary.
- 24 July 2006
- Published by AIP Publishing in Applied Physics Letters
- Vol. 89 (4) , 042907
Thermodynamics of polydomain ferroelectric bilayers and graded multilayers
The equilibrium domain structure and its evolution under an electric field in ferroelectric bilayers and graded multilayers are considered. The equilibrium bilayer is self-poled and contains single-domain and polydomain (with 180° domains) layers. The polarization of a graded multilayer proceeds by movement of wedge-like domains as a result of progressive transformation of polydomain layers to a single-domain state. The theory provides the principal explanation of dielectric behavior of graded ferroelectric films.
- 24 July 2006
- Published by AIP Publishing in Applied Physics Letters
- Vol. 89 (4) , 042907
Thermodynamics of polydomain ferroelectric bilayers and graded multilayers
The equilibrium domain structure and its evolution under an electric field in ferroelectric bilayers and graded multilayers are considered. The equilibrium bilayer is self-poled and contains single-domain and polydomain (with 180° domains) layers. The polarization of a graded multilayer proceeds by movement of wedge-like domains as a result of progressive transformation of polydomain layers to a single-domain state. The theory provides the principal explanation of dielectric behavior of graded ferroelectric films.
- 10 August 2005
- Published by AIP Publishing in Applied Physics Letters
- Vol. 87 (7) , 072907
Effect of 90° domain movement on the piezoelectric response of patterned PbZr0.2Ti0.8O3∕SrTiO3∕Si heterostructures
The converse longitudinal piezoelectric responses of heterostructures have been studied for continuous films and for islands patterned by focused ion beam milling (typical dimension is ). The intrinsic piezoelectric response of the island with an immobile polydomain structure is modeled using finite element analysis. The difference between the results of experimental measurement and modeling is explained by an extrinsic contribution to the piezoresponse from 90° domain movement. The contribution of 90° domain movement to the total piezoresponse is shown to be greatly enhanced in the patterned islands, and leads to an effective piezoelectric coefficient which is five times larger than the theoretical bulk single domain value.- 10 August 2005
- Published by AIP Publishing in Applied Physics Letters
- Vol. 87 (7) , 072907
Effect of 90° domain movement on the piezoelectric response of patterned PbZr0.2Ti0.8O3∕SrTiO3∕Si heterostructures
The converse longitudinal piezoelectric responses of heterostructures have been studied for continuous films and for islands patterned by focused ion beam milling (typical dimension is ). The intrinsic piezoelectric response of the island with an immobile polydomain structure is modeled using finite element analysis. The difference between the results of experimental measurement and modeling is explained by an extrinsic contribution to the piezoresponse from 90° domain movement. The contribution of 90° domain movement to the total piezoresponse is shown to be greatly enhanced in the patterned islands, and leads to an effective piezoelectric coefficient which is five times larger than the theoretical bulk single domain value.- 1 October 2004
- Published by Springer Nature in Journal of Materials Research
- Vol. 19 (10) , 2853-2858
Contribution of substrate to converse piezoelectric response of constrained thin films
The converse piezoelectric response of a thin film constrained by a substrate is analyzed in different geometries under various boundary conditions. We considerthe effects of elastic deformation of the substrate on the total displacement of thefilm surface induced by the electric field. The change of film thickness and the bending curvature of a film/substrate couple are calculated. For a thin film island clamped on a large thick substrate, the theoretical estimation of the piezoresponse, including a local bending in the vicinity of the island/substrate interface, is in agreement with the finite element calculation.
- 1 October 2004
- Published by Springer Nature in Journal of Materials Research
- Vol. 19 (10) , 2853-2858
Contribution of substrate to converse piezoelectric response of constrained thin films
The converse piezoelectric response of a thin film constrained by a substrate is analyzed in different geometries under various boundary conditions. We considerthe effects of elastic deformation of the substrate on the total displacement of thefilm surface induced by the electric field. The change of film thickness and the bending curvature of a film/substrate couple are calculated. For a thin film island clamped on a large thick substrate, the theoretical estimation of the piezoresponse, including a local bending in the vicinity of the island/substrate interface, is in agreement with the finite element calculation.
- 8 July 2004
- Published by AIP Publishing in Applied Physics Letters
- Vol. 85 (2) , 278-280
Orientation dependence of the converse piezoelectric constantsfor epitaxial single domain ferroelectric films
The orientation dependence of the converse piezoelectric constants in epitaxial single domain piezoelectric films constrained by substrate is calculated. The calculations are supported by the experimental measuring results of longitudinal piezoelectric constants of ferroelectric tetragonal thin films with , , and orientations.- 8 July 2004
- Published by AIP Publishing in Applied Physics Letters
- Vol. 85 (2) , 278-280
Orientation dependence of the converse piezoelectric constantsfor epitaxial single domain ferroelectric films
The orientation dependence of the converse piezoelectric constants in epitaxial single domain piezoelectric films constrained by substrate is calculated. The calculations are supported by the experimental measuring results of longitudinal piezoelectric constants of ferroelectric tetragonal thin films with , , and orientations.- 1 October 2003
- Published by EDP Sciences in Journal de Physique IV
- Vol. 112, 37-40
Martensitic transformations in constrained films
- 1 October 2003
- Published by EDP Sciences in Journal de Physique IV
- Vol. 112, 37-40
Martensitic transformations in constrained films