SCS. G. Chiuzbăian
S. G. Chiuzbăian
*This is an algorithmically generated author record based on publicly available information.
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
S. G. Chiuzbăian has a total of 7 co-authors. Here are the top co-authors by number of shared publications:
C. Dallera
INFM-Dipartimento di Fisica, Politecnico di Milano, p. Leonardo da Vinci 32, 20133 Milano, Italy
1 shared publication- Giacomo Ghiringhelli
Dipartimento di Fisica, Politecnico di Milano, Milano, Italy
1 shared publication L. Patthey
Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland
1 shared publication- Lucio Braicovich
Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milano, Italy
1 shared publication M. Grioni
IPN, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland
1 shared publicationP. Amann
Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland
1 shared publication
Latest Publications
- 31 October 2005
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 95 (19) , 197402
Localized Electronic Excitations in NiO Studied with Resonant Inelastic X-Ray Scattering at the NiThreshold: Evidence of Spin FlipWe studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni edges. The good energy resolution allows an unambiguous identification of several spectral features due to excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.- 31 October 2005
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 95 (19) , 197402
Localized Electronic Excitations in NiO Studied with Resonant Inelastic X-Ray Scattering at the NiThreshold: Evidence of Spin FlipWe studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni edges. The good energy resolution allows an unambiguous identification of several spectral features due to excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.