SGS. L. Gilbert
S. L. Gilbert
*This is an algorithmically generated author record based on publicly available information.
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
S. L. Gilbert has a total of 1 co-authors. Here are the top co-authors by number of shared publications:
W. C. Swann
Division of Optoelectronics, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80303 USA
1 shared publication
Latest Publications
- 1 July 2000
- Published by Optica Publishing Group in Journal of the Optical Society of America B
- Vol. 17 (7) , 1263-1270
Pressure-induced shift and broadening of 1510–1540-nm acetylene wavelength calibration lines
We have measured the pressure-induced shift for 15 lines of the rotational–vibrational band of acetylene These lines are useful as wavelength references in the 1510–1540-nm region. We find that the pressure shift varies from +0.008(2) pm/kPa for line to +0.043(2) pm/kPa for line with many of the lines exhibiting a shift near +0.017 pm/kPa (or, equivalently, or -0.29 MHz/Torr). In addition, we have measured the pressure broadening of these lines and find that it also varies with line number and is typically ∼0.7 pm/kPa (∼12 MHz/Torr). We also evaluate the line sensitivity to temperature changes and electromagnetic fields.- 1 July 2000
- Published by Optica Publishing Group in Journal of the Optical Society of America B
- Vol. 17 (7) , 1263-1270
Pressure-induced shift and broadening of 1510–1540-nm acetylene wavelength calibration lines
We have measured the pressure-induced shift for 15 lines of the rotational–vibrational band of acetylene These lines are useful as wavelength references in the 1510–1540-nm region. We find that the pressure shift varies from +0.008(2) pm/kPa for line to +0.043(2) pm/kPa for line with many of the lines exhibiting a shift near +0.017 pm/kPa (or, equivalently, or -0.29 MHz/Torr). In addition, we have measured the pressure broadening of these lines and find that it also varies with line number and is typically ∼0.7 pm/kPa (∼12 MHz/Torr). We also evaluate the line sensitivity to temperature changes and electromagnetic fields.