Anurag Gupta
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Previous Organizations / Institutes
The organizations / institutes from the scholar's other articles in the past ten years
Research Subjects
Anurag Gupta has a total of 11 co-authors. Here are the top co-authors by number of shared publications:
Bruce C. Kim
The University of Alabama, Tuscaloosa, USA
2 shared publicationsChristina Brantley
U.S. Army, RDECOM/AMRDEC, Redstone Arsenal, USA
2 shared publicationsEugene Edwards
U.S. Army, RDECOM/AMRDEC, Redstone Arsenal, USA
2 shared publicationsPaul Ruffin
U.S. Army, RDECOM/AMRDEC, Redstone Arsenal, USA
2 shared publicationsSeok-Ho Noh
2 shared publications- Sukeshwar Kannan
The University of Alabama
2 shared publications
Latest Publications
- 31 March 2012
- Published by Springer Nature in Applied Physics A
- Vol. 107 (3) , 709-714
Synthesis and functionalization study of hierarchical ZnO nanowires for potential nitroaromatic sensing applications
- 31 March 2012
- Published by Springer Nature in Applied Physics A
- Vol. 107 (3) , 709-714
Synthesis and functionalization study of hierarchical ZnO nanowires for potential nitroaromatic sensing applications
- 25 March 2012
- Published by Techno-Press in Advances in materials Research
- Vol. 1 (1) , 37-49
Characterization of high performance CNT-based TSV for high-frequency RF applications
- 25 March 2012
- Published by Techno-Press in Advances in materials Research
- Vol. 1 (1) , 37-49
Characterization of high performance CNT-based TSV for high-frequency RF applications
- 1 January 2012
- Published by IMAPS - International Microelectronics Assembly and Packaging Society in International Symposium on Microelectronics
- Vol. 2012 (1) , 001191-001196
Development of Synergistic Opto-Electronic Sensing Platform based on Zinc Oxide Semiconducting Nanostructures
Potential of zinc oxide nanowires for developing a sensitive opto-electronic platform was demonstrated. Zinc oxide nanowires synthesized on insulating sapphire substrates were functionalized with an optically active receptor, 1-pyrenebutyric acid. Appropriate characterization studies including XPS and FT-IR ATR are reported. I-V curves of pristine and receptor-modified nanowires were utilized to highlight the potential of zinc oxide nano-heterostructures for developing a sensitive opto-electronic platform for p-nitrophenol sensing. Packaging issues for achieving an efficient and cost-effective sensor platform have also been outlined.
- 1 January 2012
- Published by IMAPS - International Microelectronics Assembly and Packaging Society in International Symposium on Microelectronics
- Vol. 2012 (1) , 001191-001196
Development of Synergistic Opto-Electronic Sensing Platform based on Zinc Oxide Semiconducting Nanostructures
Potential of zinc oxide nanowires for developing a sensitive opto-electronic platform was demonstrated. Zinc oxide nanowires synthesized on insulating sapphire substrates were functionalized with an optically active receptor, 1-pyrenebutyric acid. Appropriate characterization studies including XPS and FT-IR ATR are reported. I-V curves of pristine and receptor-modified nanowires were utilized to highlight the potential of zinc oxide nano-heterostructures for developing a sensitive opto-electronic platform for p-nitrophenol sensing. Packaging issues for achieving an efficient and cost-effective sensor platform have also been outlined.
- 1 January 2011
- Published by IMAPS - International Microelectronics Assembly and Packaging Society in International Symposium on Microelectronics
- Vol. 2011 (1) , 000635-000640
MEMS Integrated Packaging for RF Circuit Testing and Self Calibration
This paper presents MEMS enhanced integrated packaging which provides testing and self-calibration to identify process-related defects and out of specification circuits, thereby enabling the package to calibrate itself in case of faults and defects to designed performance levels. We have developed a novel multi-tone dither test technique where the test stimulus is generated by modulating the RF carrier signal with a multi-tone signal generated using an Arbitrary Waveform Generator (AWG) with additive white Gaussian noise. This test stimulus is provided as input to the RF circuit and peak-to-average ratio (PAR) is measured at the output. For a faulty circuit, a significant difference is observed in the value of PAR as compared to a fault-free circuit. Simulation is performed for various circuit conditions such as fault-free as well as fault-induced and their corresponding PARs are stored in the look-up table. Hardware testing is performed and the results are compared with the look-up table to verify whether the device is fault-free. In faulty circuit conditions, calibration is performed using a tuning circuit which consists of MEMS switches. The entire validation of the design using test technique and self-calibration of the RF circuit is automated using the calibration algorithm. This testing and self-calibration technique is exhaustive and efficient for present-day communication systems.
- 1 January 2011
- Published by IMAPS - International Microelectronics Assembly and Packaging Society in International Symposium on Microelectronics
- Vol. 2011 (1) , 000635-000640
MEMS Integrated Packaging for RF Circuit Testing and Self Calibration
This paper presents MEMS enhanced integrated packaging which provides testing and self-calibration to identify process-related defects and out of specification circuits, thereby enabling the package to calibrate itself in case of faults and defects to designed performance levels. We have developed a novel multi-tone dither test technique where the test stimulus is generated by modulating the RF carrier signal with a multi-tone signal generated using an Arbitrary Waveform Generator (AWG) with additive white Gaussian noise. This test stimulus is provided as input to the RF circuit and peak-to-average ratio (PAR) is measured at the output. For a faulty circuit, a significant difference is observed in the value of PAR as compared to a fault-free circuit. Simulation is performed for various circuit conditions such as fault-free as well as fault-induced and their corresponding PARs are stored in the look-up table. Hardware testing is performed and the results are compared with the look-up table to verify whether the device is fault-free. In faulty circuit conditions, calibration is performed using a tuning circuit which consists of MEMS switches. The entire validation of the design using test technique and self-calibration of the RF circuit is automated using the calibration algorithm. This testing and self-calibration technique is exhaustive and efficient for present-day communication systems.