Joaquim Pratas Leitao
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Research Interests
Joaquim Pratas Leitao has a total of 387 co-authors. Here are the top co-authors by number of shared publications:
- Pedro Manuel Parracho Salomé
INL – International Iberian Nanotechnology Laboratory Avenida Mestre José Veiga 4715‐330 Braga Portugal
32 shared publications - Jennifer P. Teixeira
INL—International Iberian Nanotechnology Laboratory, Avenida Mestre José Veiga, 4715-330 Braga, Portugal
27 shared publications - Nikolai A. Sobolev
Universidade de Aveiro
26 shared publications - Paulo A. Fernandes
International Iberian Nanotechnology Laboratory, Braga, Portugal
22 shared publications - Bruno Poças Falcão
Universidade de Aveiro
18 shared publications - António Ferreira da Cunha
Universidade de Aveiro
13 shared publications
Latest Publications
- Open Access
- 31 October 2026
- Published by IOP Publishing in Journal of Physics: Energy
- Vol. 8 (4) , 045010
Recovering power after severe space degradation: annealing time effects on the resilience of CIGS solar cells
In this study, we investigated the effect of annealing time at a fixed temperature (120 °C or 180 °C) on the recovery of Cu(In,Ga)Se2 (CIGS) thin solar cells (SCs) irradiated with protons. The energy range, 80–180 keV, allowed the proton stopping region to encompass the depletion region. The photovoltaic performance and optical properties were investigated using photoluminescence (PL), J – V measurements, and external quantum efficiency measurements along the irradiation and recovery stages. The irradiation caused a reduction in power conversion efficiency of ∼92% and a quite strong modification of the radiative recombination channels, namely involving deep energy levels in the band gap. The increase in defect density resulted in an increase in Urbach energy, from 33 meV to ∼38 meV, and a reduction in the estimated band gap energy from ∼1.159 eV to ∼1.146 eV. The annealing temperature used in the recovery of the SCs has a decisive influence on the recovery. At 120 °C, the efficiency and the radiative recombination channels recover more rapidly during the first 18 h, but maximum recovery is only reached after 58 h. In contrast, at 180 °C, these aspects recover predominantly within the first 30 min, although maximum recovery takes 8 h. Analysis of the PLs temperature dependence after recovery highlighted the involvement of the V Cu defect in radiative recombination channels, independently of the annealing temperature. The results provide evidence that some defects formed during irradiation persist even after the recovery process, leading to an increased total defect density relative to the pre-irradiation condition. The relationship between annealing time, temperature, and the self-healing capacity of the CIGS is quite important for accurately predicting the behavior of these SCs to in-orbit temperature cycles. Our results support the potential of this technology for long-term missions in hostile space environments.
- 31 October 2026
- Published by IOP Publishing in Journal of Physics: Energy
- Vol. 8 (4) , 045010
Open AccessRecovering power after severe space degradation: annealing time effects on the resilience of CIGS solar cells
In this study, we investigated the effect of annealing time at a fixed temperature (120 °C or 180 °C) on the recovery of Cu(In,Ga)Se2 (CIGS) thin solar cells (SCs) irradiated with protons. The energy range, 80–180 keV, allowed the proton stopping region to encompass the depletion region. The photovoltaic performance and optical properties were investigated using photoluminescence (PL), J – V measurements, and external quantum efficiency measurements along the irradiation and recovery stages. The irradiation caused a reduction in power conversion efficiency of ∼92% and a quite strong modification of the radiative recombination channels, namely involving deep energy levels in the band gap. The increase in defect density resulted in an increase in Urbach energy, from 33 meV to ∼38 meV, and a reduction in the estimated band gap energy from ∼1.159 eV to ∼1.146 eV. The annealing temperature used in the recovery of the SCs has a decisive influence on the recovery. At 120 °C, the efficiency and the radiative recombination channels recover more rapidly during the first 18 h, but maximum recovery is only reached after 58 h. In contrast, at 180 °C, these aspects recover predominantly within the first 30 min, although maximum recovery takes 8 h. Analysis of the PLs temperature dependence after recovery highlighted the involvement of the V Cu defect in radiative recombination channels, independently of the annealing temperature. The results provide evidence that some defects formed during irradiation persist even after the recovery process, leading to an increased total defect density relative to the pre-irradiation condition. The relationship between annealing time, temperature, and the self-healing capacity of the CIGS is quite important for accurately predicting the behavior of these SCs to in-orbit temperature cycles. Our results support the potential of this technology for long-term missions in hostile space environments.
- Open Access
- 17 August 2026
- Published by Elsevier in Applied Surface Science
- Vol. 751
Laser irradiation and simultaneous functionalization with lauric acid for superhydrophobic copper surfaces in a single step – A PFAS-free alternative
- 17 August 2026
- Published by Elsevier in Applied Surface Science
- Vol. 751
Open AccessLaser irradiation and simultaneous functionalization with lauric acid for superhydrophobic copper surfaces in a single step – A PFAS-free alternative
- Open Access
- 9 June 2026
- Published by Springer Nature in Journal of Materials Science
- Vol. 61 (29) , 20966-20982
Recombination mechanisms in MA- and Cs&FA-based perovskites: composition versus photoluminescence analysis
Compositional tuning has been one of the approaches to increasing the stability of perovskites. The formation of defects in the crystalline lattice impacts not only stability but also the charge carrier recombination channels established in the film. In this work, the photoluminescence of MAPbI $$_{3-x}$$ Br $$_x$$ and Cs $$_{0.17}$$ FA $$_{0.83}$$ PbI $$_{3-y}$$ Br $$_y$$ thin films, measured at 70 K, was comparatively investigated to evaluate the influence of monovalent cations and halide anions on the formation of defects and resulting recombination mechanisms. To study the radiative transitions, measurements as a function of excitation power were done, and the spectral deconvolution performed followed by the estimation of $$\beta $$ and m parameter values. The $$\beta $$ parameter values clearly show a much higher density of defects on MA-based perovskites compared to Cs&FA-based ones, while the m parameter values suggest an increase in this density with raise of the Br content. In the case of the broad and asymmetric emission spectra in MA-based perovskites, it was observed the coexistence of radiative recombination channels involving: (i) deep defects; (ii) charge carriers or excitons that are free or bound to shallow defects. For Cs&FA-based perovskites, the luminescence is narrower and only includes the recombination of charge carriers or excitons bound to shallow defects. Additionally, it was found that in Cs&FA-based perovskites, some radiative channels remain unchanged with varying I/Br ratio. Increasing the Br content, systematically widens the band gap. The results obtained impact the influence of composition on the discussion of perovskite stability and the variation in charge carrier recombination channels, demonstrating the relevance of photoluminescence in the discussion of both issues.\query{Please suggest whether the term ‘Cs&FA-based’ can be changed to ‘Cs and FA-based’}- 9 June 2026
- Published by Springer Nature in Journal of Materials Science
- Vol. 61 (29) , 20966-20982
Open AccessRecombination mechanisms in MA- and Cs&FA-based perovskites: composition versus photoluminescence analysis
Compositional tuning has been one of the approaches to increasing the stability of perovskites. The formation of defects in the crystalline lattice impacts not only stability but also the charge carrier recombination channels established in the film. In this work, the photoluminescence of MAPbI $$_{3-x}$$ Br $$_x$$ and Cs $$_{0.17}$$ FA $$_{0.83}$$ PbI $$_{3-y}$$ Br $$_y$$ thin films, measured at 70 K, was comparatively investigated to evaluate the influence of monovalent cations and halide anions on the formation of defects and resulting recombination mechanisms. To study the radiative transitions, measurements as a function of excitation power were done, and the spectral deconvolution performed followed by the estimation of $$\beta $$ and m parameter values. The $$\beta $$ parameter values clearly show a much higher density of defects on MA-based perovskites compared to Cs&FA-based ones, while the m parameter values suggest an increase in this density with raise of the Br content. In the case of the broad and asymmetric emission spectra in MA-based perovskites, it was observed the coexistence of radiative recombination channels involving: (i) deep defects; (ii) charge carriers or excitons that are free or bound to shallow defects. For Cs&FA-based perovskites, the luminescence is narrower and only includes the recombination of charge carriers or excitons bound to shallow defects. Additionally, it was found that in Cs&FA-based perovskites, some radiative channels remain unchanged with varying I/Br ratio. Increasing the Br content, systematically widens the band gap. The results obtained impact the influence of composition on the discussion of perovskite stability and the variation in charge carrier recombination channels, demonstrating the relevance of photoluminescence in the discussion of both issues.\query{Please suggest whether the term ‘Cs&FA-based’ can be changed to ‘Cs and FA-based’} - Open Access
- 1 May 2026
- Published by Elsevier in Results in Surfaces and Interfaces
- Vol. 24
One-step surface wafer damage removal for improved interface passivation in silicon heterojunction solar cells
- 1 May 2026
- Published by Elsevier in Results in Surfaces and Interfaces
- Vol. 24
Open AccessOne-step surface wafer damage removal for improved interface passivation in silicon heterojunction solar cells
- Open Access
- 12 February 2026
- Published by Elsevier in SSRN Electronic Journal
One-Step Surface Wafer Damage Removal for Improved Interface Passivation in Silicon Heterojunction Solar Cells
This work presents an optimisation study of silicon surface preparation for silicon heterojunction solar cells (SHJ) fabricated from surface-damaged wafers, aiming to ensure minimal surface defects and improved passivation at the crystalline silicon-hydrogenated amorphous silicon (c-Si/a-Si:H) interface. KOH etching conditions were optimized to remove diamond‑wire‑saw (DWS) damage on c‑Si while tuning nanoscale faceting for improved interface passivation. Namely, KOH 45% was used to smooth the surface and remove saw damage, while KOH 5% generated approximately 20 nm pyramidal‑like features in a single‑step, IPA‑free process. For the fabrication of SHJ solar cells with an Aluminium Back Surface Field (Al-BSF), intrinsic and n-type doped a-Si:H layers were deposited by plasma-enhanced chemical vapor deposition (PECVD) on the front side of the devices. Two different (i)a-Si:H films, one dense, deposited with 50% hydrogen dilution, (id)a-Si:H, and the other, under-dense, using pure silane gas, (iud)a-Si:H, were used in different solar cells. A relative improvement of 18% in implied PCE (Suns‑Voc) was observed for KOH 5% with dense (id)a‑Si:H versus KOH 45%, which was attributed to the effect of nanoscale faceting created on the c‑Si surface by the 5% KOH treatment.
- 12 February 2026
- Published by Elsevier in SSRN Electronic Journal
Open AccessOne-Step Surface Wafer Damage Removal for Improved Interface Passivation in Silicon Heterojunction Solar Cells
This work presents an optimisation study of silicon surface preparation for silicon heterojunction solar cells (SHJ) fabricated from surface-damaged wafers, aiming to ensure minimal surface defects and improved passivation at the crystalline silicon-hydrogenated amorphous silicon (c-Si/a-Si:H) interface. KOH etching conditions were optimized to remove diamond‑wire‑saw (DWS) damage on c‑Si while tuning nanoscale faceting for improved interface passivation. Namely, KOH 45% was used to smooth the surface and remove saw damage, while KOH 5% generated approximately 20 nm pyramidal‑like features in a single‑step, IPA‑free process. For the fabrication of SHJ solar cells with an Aluminium Back Surface Field (Al-BSF), intrinsic and n-type doped a-Si:H layers were deposited by plasma-enhanced chemical vapor deposition (PECVD) on the front side of the devices. Two different (i)a-Si:H films, one dense, deposited with 50% hydrogen dilution, (id)a-Si:H, and the other, under-dense, using pure silane gas, (iud)a-Si:H, were used in different solar cells. A relative improvement of 18% in implied PCE (Suns‑Voc) was observed for KOH 5% with dense (id)a‑Si:H versus KOH 45%, which was attributed to the effect of nanoscale faceting created on the c‑Si surface by the 5% KOH treatment.
- Open Access
- 4 December 2025
- Published by Wiley in Physica Status Solidi (RRL) – Rapid Research Letters
- Vol. 20 (2)
Performing Relevant Irradiation Experiments: The Role of Proton Flux in the Dynamic Annealing during Irradiation of Cu(In,Ga)Se 2 ‐Based Solar Cells
Laboratory irradiation tests are crucial to evaluate the viability of photovoltaic technologies for space applications. This work investigates the effect of the proton flux on the radiation hardness of Cu(In,Ga)Se 2 ‐based solar cells. Two solar cells were irradiated with 1 MeV protons at equal fluence (∼10 13 H + cm − 2 ) under distinct fluxes. The optical and electrical characterization revealed that the proton irradiation induces a higher density of defects, some deep in the bandgap, leading to the emergence of new recombination channels and the degradation of the device's performance. Besides the common degradation observed for both cells, the extent of damage shows a dependency on the irradiation flux. The cell irradiated with a lower proton flux exhibited greater degradation of its open‐circuit voltage, fill factor, power conversion efficiency, and a higher density of deep defects in the bandgap. On the other hand, the higher flux caused stronger losses both in external quantum efficiency and short‐circuit current, suggesting a different nature of the induced damage. Altogether, these findings point to a flux‐dependent balance between defect generation and dynamic annealing processes that occur during irradiation, highlighting the need to consider the irradiation flux as a critical parameter in radiation hardness studies of space‐aimed photovoltaic technologies.
- 4 December 2025
- Published by Wiley in Physica Status Solidi (RRL) – Rapid Research Letters
- Vol. 20 (2)
Open AccessPerforming Relevant Irradiation Experiments: The Role of Proton Flux in the Dynamic Annealing during Irradiation of Cu(In,Ga)Se 2 ‐Based Solar Cells
Laboratory irradiation tests are crucial to evaluate the viability of photovoltaic technologies for space applications. This work investigates the effect of the proton flux on the radiation hardness of Cu(In,Ga)Se 2 ‐based solar cells. Two solar cells were irradiated with 1 MeV protons at equal fluence (∼10 13 H + cm − 2 ) under distinct fluxes. The optical and electrical characterization revealed that the proton irradiation induces a higher density of defects, some deep in the bandgap, leading to the emergence of new recombination channels and the degradation of the device's performance. Besides the common degradation observed for both cells, the extent of damage shows a dependency on the irradiation flux. The cell irradiated with a lower proton flux exhibited greater degradation of its open‐circuit voltage, fill factor, power conversion efficiency, and a higher density of deep defects in the bandgap. On the other hand, the higher flux caused stronger losses both in external quantum efficiency and short‐circuit current, suggesting a different nature of the induced damage. Altogether, these findings point to a flux‐dependent balance between defect generation and dynamic annealing processes that occur during irradiation, highlighting the need to consider the irradiation flux as a critical parameter in radiation hardness studies of space‐aimed photovoltaic technologies.
- Open Access
- 3 December 2025
- Published by Royal Society of Chemistry (RSC) in Journal of Materials Chemistry A
- Vol. 14 (3) , 1666-1680
Strain engineering of ScN thin films and its effect on optical, electrical, and thermoelectric properties
Scandium nitride (ScN) is a cubic NaCl-structured, degenerate, narrow-bandgap, n-type semiconductor that exhibits remarkable semiconducting, thermoelectric and plasmonic properties. However, its properties are sensitive to several types of defects, such as crystal defects, morphology, intentional or unintentional doping. For the purpose of reducing the deposition temperature of ScN, a series of films were deposited in the temperature range of 250–850 °C using a high-power impulse magnetron sputtering technique. While the stoichiometry and crystal structure remained unaffected in the sample series, the optical and electrical properties were affected when the temperature was decreased. Using in-depth XRD, optical and electrical characterizations, the effect of strain and dislocations on the semiconductor properties of ScN was evaluated. A reduction in the deposition temperature from 850 °C to 450 °C yielded a slow change in the electrical and optical properties, while a drastic change occurred for the films deposited below 450 °C. The main cause of the deterioration of the electrical transport properties (σ/10 000; n/100, and µ/100) was attributed to a high dislocation density (1011 cm−2) along with a rhombohedral distortion of the ScN cell (α: 90° → 88.6°), which was the main cause of the variation in the electrical transport. The presence of dislocations/crystal defects in the film generated defect states near the edges of the valence and conduction bands, softening the edges and impacting the electron density and mobility. The best thermoelectric properties of ScN were obtained when it was grown at 850 °C and were further modified and altered by strain engineering.
- 3 December 2025
- Published by Royal Society of Chemistry (RSC) in Journal of Materials Chemistry A
- Vol. 14 (3) , 1666-1680
Open AccessStrain engineering of ScN thin films and its effect on optical, electrical, and thermoelectric properties
Scandium nitride (ScN) is a cubic NaCl-structured, degenerate, narrow-bandgap, n-type semiconductor that exhibits remarkable semiconducting, thermoelectric and plasmonic properties. However, its properties are sensitive to several types of defects, such as crystal defects, morphology, intentional or unintentional doping. For the purpose of reducing the deposition temperature of ScN, a series of films were deposited in the temperature range of 250–850 °C using a high-power impulse magnetron sputtering technique. While the stoichiometry and crystal structure remained unaffected in the sample series, the optical and electrical properties were affected when the temperature was decreased. Using in-depth XRD, optical and electrical characterizations, the effect of strain and dislocations on the semiconductor properties of ScN was evaluated. A reduction in the deposition temperature from 850 °C to 450 °C yielded a slow change in the electrical and optical properties, while a drastic change occurred for the films deposited below 450 °C. The main cause of the deterioration of the electrical transport properties (σ/10 000; n/100, and µ/100) was attributed to a high dislocation density (1011 cm−2) along with a rhombohedral distortion of the ScN cell (α: 90° → 88.6°), which was the main cause of the variation in the electrical transport. The presence of dislocations/crystal defects in the film generated defect states near the edges of the valence and conduction bands, softening the edges and impacting the electron density and mobility. The best thermoelectric properties of ScN were obtained when it was grown at 850 °C and were further modified and altered by strain engineering.
- Open Access
- 20 November 2025
- Published by Royal Society of Chemistry (RSC) in Materials Advances
- Vol. 7 (2) , 845-853
Optimization of the crystalline silicon surface by chemical treatment and hydrogenated amorphous silicon: a photoluminescence study
Luminescence study of the c-Si surface for treatment with 5% KOH and deposition of a-Si:H in a SiH 4 and 50% H 2 environment.
- 20 November 2025
- Published by Royal Society of Chemistry (RSC) in Materials Advances
- Vol. 7 (2) , 845-853
Open AccessOptimization of the crystalline silicon surface by chemical treatment and hydrogenated amorphous silicon: a photoluminescence study
Luminescence study of the c-Si surface for treatment with 5% KOH and deposition of a-Si:H in a SiH 4 and 50% H 2 environment.
- 20 August 2025
- Published by Royal Society of Chemistry (RSC) in Journal of Materials Chemistry C
- Vol. 13 (39) , 20021-20039
Zn2GeO4:Cr,Mn phosphor for visible to NIR luminescence-based applications – a theoretical and experimental investigation
Zn2GeO4 (ZGeO) phosphor exhibits a wide bandgap energy, making it highly suitable for luminescence-based applications spanning the entire electromagnetic spectrum, from ultraviolet (UV) to near-infrared (NIR) wavelengths.
- 20 August 2025
- Published by Royal Society of Chemistry (RSC) in Journal of Materials Chemistry C
- Vol. 13 (39) , 20021-20039
Zn2GeO4:Cr,Mn phosphor for visible to NIR luminescence-based applications – a theoretical and experimental investigation
Zn2GeO4 (ZGeO) phosphor exhibits a wide bandgap energy, making it highly suitable for luminescence-based applications spanning the entire electromagnetic spectrum, from ultraviolet (UV) to near-infrared (NIR) wavelengths.
- Open Access
- 26 June 2025
- Published by IOP Publishing in Journal of Physics: Energy
- Vol. 7 (3) , 035021
Evaluating 1 MeV proton damage in Cu(In,Ga)Se2 solar cells and a recovery pathway
The resilience of chalcogenide-based solar cells (SCs) in the space environment is crucial for their application in satellite power systems. In this experimental study, we investigate the effects of 1 MeV proton irradiation at fluences ranging from 3 × 10 10 to 1014 H + cm−2 on the optoelectronic properties of Cu(In,Ga)Se2 (CIGS) based SCs. In situ and ex situ electrical characterization revealed that irradiation causes degradation of the diode parameters and the electrical performance of the device, in particular the open-circuit voltage ( V OC ), fill factor and power conversion efficiency (η). Fluences above 1013 H + cm−2 caused significant degradation of the SCs. Keeping the SCs at room temperature, ambient atmosphere and in the dark did not contribute significantly to the SC recovery. The photoluminescence (PL) analysis revealed an increase in the defect density leading to the formation of deeper radiative recombination channels, as well as non-radiative ones, and an increase on the magnitude of the fluctuating potentials. In order to revert this degradation, we explored a heat-light soaking (HLS) treatment that consisted in exposing the SCs to light incidence at a temperature slightly above 90 ° C. This treatment significantly restored the device’s electrical performance and the luminescence properties, demonstrating partial defect annihilation and restoration of the CIGS electronic structure. Interestingly, a non-irradiated SC subjected to the same HLS treatment showed no significant beneficial effect on the performance of the SC, which confirms the link between the observed recovery of the irradiated SCs and the annihilation of irradiation-induced defects. The findings of this work suggest that HLS is an effective, space-compatible self-healing mechanism that mitigates radiation damage in CIGS SCs, potentially enabling satellite SCs to be designed without cover glass.
- 26 June 2025
- Published by IOP Publishing in Journal of Physics: Energy
- Vol. 7 (3) , 035021
Open AccessEvaluating 1 MeV proton damage in Cu(In,Ga)Se2 solar cells and a recovery pathway
The resilience of chalcogenide-based solar cells (SCs) in the space environment is crucial for their application in satellite power systems. In this experimental study, we investigate the effects of 1 MeV proton irradiation at fluences ranging from 3 × 10 10 to 1014 H + cm−2 on the optoelectronic properties of Cu(In,Ga)Se2 (CIGS) based SCs. In situ and ex situ electrical characterization revealed that irradiation causes degradation of the diode parameters and the electrical performance of the device, in particular the open-circuit voltage ( V OC ), fill factor and power conversion efficiency (η). Fluences above 1013 H + cm−2 caused significant degradation of the SCs. Keeping the SCs at room temperature, ambient atmosphere and in the dark did not contribute significantly to the SC recovery. The photoluminescence (PL) analysis revealed an increase in the defect density leading to the formation of deeper radiative recombination channels, as well as non-radiative ones, and an increase on the magnitude of the fluctuating potentials. In order to revert this degradation, we explored a heat-light soaking (HLS) treatment that consisted in exposing the SCs to light incidence at a temperature slightly above 90 ° C. This treatment significantly restored the device’s electrical performance and the luminescence properties, demonstrating partial defect annihilation and restoration of the CIGS electronic structure. Interestingly, a non-irradiated SC subjected to the same HLS treatment showed no significant beneficial effect on the performance of the SC, which confirms the link between the observed recovery of the irradiated SCs and the annihilation of irradiation-induced defects. The findings of this work suggest that HLS is an effective, space-compatible self-healing mechanism that mitigates radiation damage in CIGS SCs, potentially enabling satellite SCs to be designed without cover glass.