Luciano Velardi

Hollow nanoparticles (HNPs) – widely studied for their unique properties - are observed for the first time forming via spark ablation, driven by the ultrarapid quenching of splashed NPs, unlocking new insights into these fascinating structures.

This study deals with diamond films grown via the microwave plasma-enhanced chemical vapor deposition technique (MWPECVD) on molybdenum (Mo) substrates of different roughness. This work is motivated by the necessity of overcoming the poor adhesion of diamond films on smooth Mo substrates, to ensure their effective application as cathodes for aerospace propulsion. The deposition process was monitored in situ using pyrometric interferometry (PI), thus enabling the real-time monitoring of both the rate and the temperature of deposition. The characterization of the obtained diamond films was performed using different techniques, such as Raman spectroscopy, X-ray diffraction (XRD), and scanning electron microscopy (SEM). The poor adhesion of diamond films on Mo substrates was solved by roughening their surface, which promotes residual stress reduction in the diamond films. In this work, the PI technique was also exploited to support the prediction of the adhesion and stability of diamond films before their exposure in air through the monitoring of the deposition temperature. This represents a novel point of our work that has never been discussed in other research papers, as pyrometric interferometry is generally mainly used to assess the rate and the temperature of deposition.

This paper deals with diamond films grown by microwave plasma enhanced chemical vapor deposition technique (MWPECVD) on molybdenum (Mo) substrates of different roughness. The work is motivated by the necessity to overcome the poor adhesion of diamond films on smooth Mo substrates, to be effectively applied as cathodes for aerospace propulsion. The deposition process was monitored in situ by pyrometric interferometry (PI), thus enabling the real-time monitoring of both the rate and the temperature of deposition. The characterization of the obtained diamond films was performed by different techniques such as Raman spectroscopy, X-ray diffraction (XRD) and scanning electron microscopy (SEM). The poor adhesion of diamond films on smooth Mo was solved by roughening the surface substrates, decreasing thermal and intrinsic stresses of the films compared to those depos-ited on smooth ones. In this work, PI technique supported the prediction of the adhesion and the stability of diamond films before their exposure in air, simply by monitoring the deposition temperature. This is a very interesting aspect that has never been addressed in research papers, as pyrometric interferometry is generally used to assess the rate and the temperature of deposition.

The demand for a “green” approach to the synthesis of nanomaterials is becoming increasingly pressing. In response to this need, we present, for the first time, the use of spark ablation as an environmentally friendly deposition technique to obtain nanoparticles of copper nitride, a material that is gaining increasing attention in the field of photovoltaic advanced technologies. This method involves the ablation of pure copper electrodes in nitrogen atmosphere while a spark current is tuned. The overall result is the co-presence of nitride and oxide nanoparticle agglomerates with different sizes according to the spark current, as confirmed by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and energy-dispersive spectroscopy techniques. Scanning probe microscopy and scanning electron microscopy show an increase in the number and size of nanoparticle agglomerates with an increasing current, while the nanoparticle size is always about sub-10 nm. The findings of this work promote spark ablation as a simple, versatile, cost-effective, environmentally friendly deposition method to obtain nitride-based nanoparticles. Furthermore, it is compatible with many types of materials and substrates, increasing the possible combinations of metals/semiconductors and carrier gas types to obtain completely innovative materials with unique compositions and properties.

This work investigates the physical properties of Al1−xScxN thin films sputtered at low temperatures by varying the process conditions. Specifically, the films were deposited at room temperature by applying a radio frequency power equal to 150 W to an AlSc alloy (60:40) target, varying the nitrogen flux percentage in the (Ar + N2) sputtering atmosphere (30%, 40%, 50%, and 60%) and keeping constant the working pressure at 5 × 10−3 mbar. The structural and chemical properties of the Al1−xScxN films were studied by x-ray diffraction and Rutherford backscattering spectrometry techniques, respectively. The piezoelectric response was investigated by piezoresponse force microscopy. In addition, the surface potential was evaluated for the first time for Sc-doped AlN thin films by Kelvin probe force microscopy, providing piezoelectric coefficients free from the no-piezoelectric additional effect to the mechanical deformation, i.e., the electrostatic force. By alloying AlN with scandium, the piezoelectric response was strongly enhanced (up to 200% compared to undoped AlN), despite the low deposition temperature and the absence of any other additional energy source supplied to the adatoms during thin film growth, which generally promotes a better structural arrangement of polycrystalline film. This is a strategic result in the field of microelectromechanical systems completely fabricated at low temperatures.