Taisuke T. Sasaki
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Taisuke T. Sasaki has a total of 337 co-authors. Here are the top co-authors by number of shared publications:
- Kazuhiro Hono
Research Center for Magnetic and Spintronics Materials, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba 305-0047, Japan
40 shared publications - Yuya Sakuraba
Research Center for Magnetic and Spintronic Materials, National Institute for Materials Science, Tsukuba, Japan
21 shared publications - Tomoya Nakatani
National Institute for Materials Science
14 shared publications - Hirofumi Suto
National Institute for Materials Science
10 shared publications - Tadakatsu Ohkubo
National Institute for Materials Science (NIMS)
10 shared publications - Shigeharu Kamado
Department of Mechanical Engineering, Nagaoka University of Technology, Nagaoka 940-2188, Japan
9 shared publications
Latest Publications
- 15 October 2026
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 140 (15)
Orientation-controlled epitaxy of CoSn anisotropic conductive thin films on sapphire substrates toward interconnect applications
The increasing resistivity of Cu interconnects at reduced device dimensions requires alternative conductors with suppressed size effects of resistivity. Materials with highly anisotropic electronic transport are a promising solution. CoSn exhibits pseudo-one-dimensional transport along the c axis with low resistivity comparable to conventional metals, making it a promising candidate for next-generation interconnects. In this study, we investigate the epitaxial growth of CoSn thin films on sapphire substrates with controlled crystallographic orientations to align the low-resistivity c axis in the plane. We successfully grow single-crystalline CoSn(101¯0) and CoSn(112¯0) films on sapphire substrates using appropriate buffer layers. Although the (112¯0) plane has a higher atomic packing density and is thus expected to yield lower surface energy and smoother films based on an analogy with conventional metals, the two orientations show markedly different surface morphologies: CoSn(101¯0) forms comparatively smooth films, whereas CoSn(112¯0) exhibits pronounced {101¯0}-faceting and rough surfaces. First-principles calculations reveal that the (101¯0) surface has lower surface energy than the (112¯0) surface, consistent with the experimentally observed facet formation. This demonstrates that surface energetics in CoSn are governed not by atomic packing density but by anisotropic bonding associated with the kagome lattice. Electrical transport measurements reveal strong dependence of resistivity on crystallographic orientation, consistent with the bulk properties, with the lowest resistivity achieved along the c axis, down to 10.6 μΩ cm for 50 nm-thick CoSn(101¯0). This work establishes orientation-controlled epitaxy on 300 mm-wafer-compatible sapphire substrates as a viable strategy for integrating CoSn into next-generation interconnect architectures.
- 15 October 2026
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 140 (15)
Orientation-controlled epitaxy of CoSn anisotropic conductive thin films on sapphire substrates toward interconnect applications
The increasing resistivity of Cu interconnects at reduced device dimensions requires alternative conductors with suppressed size effects of resistivity. Materials with highly anisotropic electronic transport are a promising solution. CoSn exhibits pseudo-one-dimensional transport along the c axis with low resistivity comparable to conventional metals, making it a promising candidate for next-generation interconnects. In this study, we investigate the epitaxial growth of CoSn thin films on sapphire substrates with controlled crystallographic orientations to align the low-resistivity c axis in the plane. We successfully grow single-crystalline CoSn(101¯0) and CoSn(112¯0) films on sapphire substrates using appropriate buffer layers. Although the (112¯0) plane has a higher atomic packing density and is thus expected to yield lower surface energy and smoother films based on an analogy with conventional metals, the two orientations show markedly different surface morphologies: CoSn(101¯0) forms comparatively smooth films, whereas CoSn(112¯0) exhibits pronounced {101¯0}-faceting and rough surfaces. First-principles calculations reveal that the (101¯0) surface has lower surface energy than the (112¯0) surface, consistent with the experimentally observed facet formation. This demonstrates that surface energetics in CoSn are governed not by atomic packing density but by anisotropic bonding associated with the kagome lattice. Electrical transport measurements reveal strong dependence of resistivity on crystallographic orientation, consistent with the bulk properties, with the lowest resistivity achieved along the c axis, down to 10.6 μΩ cm for 50 nm-thick CoSn(101¯0). This work establishes orientation-controlled epitaxy on 300 mm-wafer-compatible sapphire substrates as a viable strategy for integrating CoSn into next-generation interconnect architectures.
- Open Access
- 21 September 2026
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 977
Evaluation of ductility-dip cracking under elevated-temperature loading in Inconel 738LC fabricated via laser powder bed fusion
- 21 September 2026
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 977
Open AccessEvaluation of ductility-dip cracking under elevated-temperature loading in Inconel 738LC fabricated via laser powder bed fusion
- Open Access
- 7 July 2026
- Published by Elsevier in SSRN Electronic Journal
Evaluation of ductility-dip cracking under elevated-temperature loading in Inconel 738LC fabricated via laser powder bed fusion
Ductility-dip cracking is a type of solid-state cracking with corresponding ductility loss that is associated with solidification processes in FCC metals and alloys, including Ni-based alloys, at temperatures of typically 0.5 – 0.7 of the alloy melting point. The prevalence of this type of cracking during the tensile deformation of additively manufactured Inconel 738LC at elevated temperature was investigated in this study. Dog bone specimens were machined from IN738LC cylindrical samples fabricated via laser powder bed fusion. Noticeable ductility reduction was observed under tensile loading at 800°C – 900°C. Additionally, it was discovered that extensive cracking at intra-columnar high angle grain boundaries occurred along with significant γʹ precipitation, following tensile loading at 900°C. Furthermore, formation of γʹ along the high angle intra-columnar grain boundaries was revealed via transmission electron microscopy. It is concluded that the presence of a thin, discontinuous layer of grain boundary γʹ causes a loss of cohesion, and therefore weakens the boundaries, leading to easier grain boundary sliding, and ultimately, cracking.
- 7 July 2026
- Published by Elsevier in SSRN Electronic Journal
Open AccessEvaluation of ductility-dip cracking under elevated-temperature loading in Inconel 738LC fabricated via laser powder bed fusion
Ductility-dip cracking is a type of solid-state cracking with corresponding ductility loss that is associated with solidification processes in FCC metals and alloys, including Ni-based alloys, at temperatures of typically 0.5 – 0.7 of the alloy melting point. The prevalence of this type of cracking during the tensile deformation of additively manufactured Inconel 738LC at elevated temperature was investigated in this study. Dog bone specimens were machined from IN738LC cylindrical samples fabricated via laser powder bed fusion. Noticeable ductility reduction was observed under tensile loading at 800°C – 900°C. Additionally, it was discovered that extensive cracking at intra-columnar high angle grain boundaries occurred along with significant γʹ precipitation, following tensile loading at 900°C. Furthermore, formation of γʹ along the high angle intra-columnar grain boundaries was revealed via transmission electron microscopy. It is concluded that the presence of a thin, discontinuous layer of grain boundary γʹ causes a loss of cohesion, and therefore weakens the boundaries, leading to easier grain boundary sliding, and ultimately, cracking.
- 4 May 2026
- Published by American Physical Society (APS) in Physical Review B
- Vol. 113 (18)
Mechanism of anomalous Hall and Nernst effects in quasi-two-dimensional MnAlGe epitaxial thin films
- 4 May 2026
- Published by American Physical Society (APS) in Physical Review B
- Vol. 113 (18)
Mechanism of anomalous Hall and Nernst effects in quasi-two-dimensional MnAlGe epitaxial thin films
- Open Access
- 26 February 2026
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 139 (8)
Excimer-laser-annealing-induced crystallization and atomic ordering of Co2Mn0.5Fe0.5Ge Heusler alloy thin films for spintronic applications
Magnetic Heusler alloys are highly attractive for spintronics; however, realizing their full potential requires high-temperature annealing, which is often incompatible with practical device fabrication. Excimer laser annealing (ELA) potentially addresses this temperature constraint by making use of the short annealing time and temperature gradient along the depth direction. We investigated the effect of ELA on Co2Mn0.5Fe0.5Ge half-metallic Heusler-alloy thin films and demonstrated that ELA successfully induces crystallization and B2 atomic ordering. Optimized ELA condition using low fluence with a high number of laser irradiations achieved reduced resistivity and negative anisotropic magnetoresistance, indicating improved atomic ordering and high spin polarization, while maintaining flatness of the films. These findings establish ELA as a viable annealing method for integrating high-performance Heusler alloys into the device structure with strict thermal budget. Moreover, ELA offers additional advantages such as enhanced throughput and selective area annealing, thereby broadening the scope of Heusler-alloy applications in spintronic devices.
- 26 February 2026
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 139 (8)
Open AccessExcimer-laser-annealing-induced crystallization and atomic ordering of Co2Mn0.5Fe0.5Ge Heusler alloy thin films for spintronic applications
Magnetic Heusler alloys are highly attractive for spintronics; however, realizing their full potential requires high-temperature annealing, which is often incompatible with practical device fabrication. Excimer laser annealing (ELA) potentially addresses this temperature constraint by making use of the short annealing time and temperature gradient along the depth direction. We investigated the effect of ELA on Co2Mn0.5Fe0.5Ge half-metallic Heusler-alloy thin films and demonstrated that ELA successfully induces crystallization and B2 atomic ordering. Optimized ELA condition using low fluence with a high number of laser irradiations achieved reduced resistivity and negative anisotropic magnetoresistance, indicating improved atomic ordering and high spin polarization, while maintaining flatness of the films. These findings establish ELA as a viable annealing method for integrating high-performance Heusler alloys into the device structure with strict thermal budget. Moreover, ELA offers additional advantages such as enhanced throughput and selective area annealing, thereby broadening the scope of Heusler-alloy applications in spintronic devices.