Maria E. Pozo de Fernandez
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Maria E. Pozo de Fernandez has a total of 18 co-authors. Here are the top co-authors by number of shared publications:
Christopher Lowrie
Florida Institute of Technology
2 shared publicationsJohn A. Zollweg
2 shared publications- Susan K. Earles
ECE department, Florida Institute of Technology, Melbourne, Florida, USA
2 shared publications W.B. Streett
2 shared publicationsWilliam B. Streett
2 shared publicationsC. David Cooper
Dept. of Civil and Environmental Engineering, Univ. of Central Florida, P.O. Box 162450, Orlando, FL 32816-2450
1 shared publication
Latest Publications
- 7 February 2008
- Published by SPIE-Intl Soc Optical Eng
- p. 689818-689818-7
Hydrogen sensor using optical reflectance from porous silicon with a palladium thin film
Results of a hydrogen sensor based on light scattering from a porous silicon surface coated with a thin palladium film are discussed. Reflected light scattered from the rough surface of porous silicon surface with a thin palladium film is compared before and after exposure to hydrogen gas. After exposure to hydrogen gas the sensor's optical reflectance is decreased indicating the presence of hydrogen.
- 7 February 2008
- Published by SPIE-Intl Soc Optical Eng
- p. 689818-689818-7
Hydrogen sensor using optical reflectance from porous silicon with a palladium thin film
Results of a hydrogen sensor based on light scattering from a porous silicon surface coated with a thin palladium film are discussed. Reflected light scattered from the rough surface of porous silicon surface with a thin palladium film is compared before and after exposure to hydrogen gas. After exposure to hydrogen gas the sensor's optical reflectance is decreased indicating the presence of hydrogen.
- 7 February 2008
- Published by SPIE-Intl Soc Optical Eng
- Vol. 6898
Porous silicon surface feature size estimation using the reflectance spectrum
In this paper we excite the surface of porous silicon with incoherent, broad band white light and observe the spectrum of colors reflected from the surface. Using an atomic force microscope images from red and green porous silicon samples are collected. In this paper we relate the optical color of the surface to the size of scattering features on the textured surface. From image segmentation using the watershed transform the height distributions of the optical scattering features are determined. The heights of these surface features are then used as input variables to a computer simulation of a reflective grating. The computer predicted color is compared to the measured color. In this manner, by inspection of the reflected color from the textured porous silicon surface the physical size of the surface features can be estimated.
- 7 February 2008
- Published by SPIE-Intl Soc Optical Eng
- Vol. 6898
Porous silicon surface feature size estimation using the reflectance spectrum
In this paper we excite the surface of porous silicon with incoherent, broad band white light and observe the spectrum of colors reflected from the surface. Using an atomic force microscope images from red and green porous silicon samples are collected. In this paper we relate the optical color of the surface to the size of scattering features on the textured surface. From image segmentation using the watershed transform the height distributions of the optical scattering features are determined. The heights of these surface features are then used as input variables to a computer simulation of a reflective grating. The computer predicted color is compared to the measured color. In this manner, by inspection of the reflected color from the textured porous silicon surface the physical size of the surface features can be estimated.
- 1 January 2008
- Published by Springer Nature in MRS Proceedings
- Vol. 1098
Electrical and optical responsivity of thin palladium films during hydrogen exposure
- 1 January 2008
- Published by Springer Nature in MRS Proceedings
- Vol. 1098
Electrical and optical responsivity of thin palladium films during hydrogen exposure
- 1 January 2002
- Published by American Society of Civil Engineers (ASCE) in Journal of Environmental Engineering
- Vol. 128 (1) , 68-72
Investigation of Ultraviolet Light-Enhanced H2O2 Oxidation of NOx Emissions
Injecting aqueous solutions of hydrogen peroxide (H2O2) into hot flue gases can convert nitric oxide (NO) to higher oxidation states (NO2, HNO2, and HNO3), which can then be removed in a wet scrubber. The optimum temperature for such conversion is 500°C (930°F), at which H2O2 is thermally “activated” (split into free radicals). At lower temperatures ultraviolet (UV) light can be used to activate the peroxide molecules. In this pilot plant study at Kennedy Space Center, experiments were done with none, one, or two UV lamps on, with and without SO2 present in the flue gases, at various temperatures, and with various injection rates of peroxide. Temperatures ranged from 117 to 350°C (243 to 660°F), and the molar ratios (peroxide to NOx) ranged from 0.68 to 5.02. Conversions of NO varied from below 10 to above 70%, with the highest conversions occurring with higher temperatures, higher dosages of hydrogen peroxide, and with both UV lamps turned on. Conversions of NOx (NO+NO2) varied from below 5 to above 40%....
- 1 January 2002
- Published by American Society of Civil Engineers (ASCE) in Journal of Environmental Engineering
- Vol. 128 (1) , 68-72
Investigation of Ultraviolet Light-Enhanced H2O2 Oxidation of NOx Emissions
Injecting aqueous solutions of hydrogen peroxide (H2O2) into hot flue gases can convert nitric oxide (NO) to higher oxidation states (NO2, HNO2, and HNO3), which can then be removed in a wet scrubber. The optimum temperature for such conversion is 500°C (930°F), at which H2O2 is thermally “activated” (split into free radicals). At lower temperatures ultraviolet (UV) light can be used to activate the peroxide molecules. In this pilot plant study at Kennedy Space Center, experiments were done with none, one, or two UV lamps on, with and without SO2 present in the flue gases, at various temperatures, and with various injection rates of peroxide. Temperatures ranged from 117 to 350°C (243 to 660°F), and the molar ratios (peroxide to NOx) ranged from 0.68 to 5.02. Conversions of NO varied from below 10 to above 70%, with the highest conversions occurring with higher temperatures, higher dosages of hydrogen peroxide, and with both UV lamps turned on. Conversions of NOx (NO+NO2) varied from below 5 to above 40%....
- 1 July 1990
- Published by American Chemical Society (ACS) in Journal of Chemical & Engineering Data
- Vol. 35 (3) , 278-283
Vapor-liquid equilibrium in the system carbon dioxide + 2,2-dimethylpropane from 262 to 424 K at pressures to 8.4 MPa
- 1 July 1990
- Published by American Chemical Society (ACS) in Journal of Chemical & Engineering Data
- Vol. 35 (3) , 278-283
Vapor-liquid equilibrium in the system carbon dioxide + 2,2-dimethylpropane from 262 to 424 K at pressures to 8.4 MPa
- 1 July 1989
- Published by American Chemical Society (ACS) in Journal of Chemical & Engineering Data
- Vol. 34 (3) , 319-323
Vapor-liquid equilibrium in the system carbon dioxide + n-pentane from 252 to 458 K at pressures to 10 MPa
- 1 July 1989
- Published by American Chemical Society (ACS) in Journal of Chemical & Engineering Data
- Vol. 34 (3) , 319-323
Vapor-liquid equilibrium in the system carbon dioxide + n-pentane from 252 to 458 K at pressures to 10 MPa
- Open Access
- 2 October 1987
- Published by Elsevier in Fluid Phase Equilibria
- Vol. 36, 91-97
Fluid phase equilibria for the binary system dimethyl ether / 1-butene
- 2 October 1987
- Published by Elsevier in Fluid Phase Equilibria
- Vol. 36, 91-97
Open AccessFluid phase equilibria for the binary system dimethyl ether / 1-butene
- 1 January 1983
- Published by Elsevier in Fluid Phase Equilibria
- Vol. 14, 219-224
Fluid phase equilibria in the system dimethyl ether/water from 50 to 220 C and pressures to 500 bar
- 1 January 1983
- Published by Elsevier in Fluid Phase Equilibria
- Vol. 14, 219-224
Fluid phase equilibria in the system dimethyl ether/water from 50 to 220 C and pressures to 500 bar