Zheng-Dong Luo
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Zheng-Dong Luo has a total of 192 co-authors. Here are the top co-authors by number of shared publications:
Genquan Han
Hangzhou Institute of Technology Xidian University Hangzhou 311200 China
11 shared publicationsDawei Zhang
Department of Physics University of Warwick Coventry CV4 7AL UK
10 shared publications- Xuetao Gan
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, and Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi’an 710129, China
9 shared publications Yan Liu
Hangzhou Institute of Technology Xidian University Hangzhou 311200 China
9 shared publications- Marin Alexe
University of Warwick
7 shared publications Yue Hao
State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology School of Microelectronics Xidian University Xi'an 710071 China
7 shared publications
Latest Publications
- 7 October 2025
- Published by Wiley in Advanced Functional Materials
- Vol. 36 (18)
Multi‐Terminal Operability in Van Der Waals Ferroelectric Field‐Effect Memtransistors for Logic‐in‐Memory and Neuromorphic Computing
Ferroelectric‐based non‐volatile memories (NVMs), which can merge logic and memory functionalities within a single device, represent a promising solution for future in‐memory computing architecture. Although various types of ferroelectric‐based NVM are demonstrated, a device concept integrating compact structure, reconfigurable operation and superior performance that can meet the demands of the emerging in‐memory computing remains to be explored. Here, a new type of device termed ferroelectric field‐effect memtransistor (FeFEMT) is reported, which features a multifunctional device operation scheme using the proposed multi‐terminal operability. In this device, multi‐level non‐volatile conductance switching based on the ferroelectric polarisation switching and the multidomain structure can be achieved with either gate‐ or drain‐voltage control. The device operates with control voltage inputs from both drain and gate terminals, enabling a single‐transistor structure two‐input Boolean logic‐in‐memory gate. Furthermore, the drain‐voltage controlled multidomain structure enables the FeFEMT to function as a two‐terminal synaptic transistor, showing excellent analogue conductance switching with over 7‐bit conductance states. The demonstrated synaptic properties consequently facilitate the simulation of implementation of a convolutional neural network, offering a superior inference performance. These findings highlight the prospects of the FeFEMTs as a suitable device technology for diverse and high‐efficiency in‐memory computing hardware platform.
- 7 October 2025
- Published by Wiley in Advanced Functional Materials
- Vol. 36 (18)
Multi‐Terminal Operability in Van Der Waals Ferroelectric Field‐Effect Memtransistors for Logic‐in‐Memory and Neuromorphic Computing
Ferroelectric‐based non‐volatile memories (NVMs), which can merge logic and memory functionalities within a single device, represent a promising solution for future in‐memory computing architecture. Although various types of ferroelectric‐based NVM are demonstrated, a device concept integrating compact structure, reconfigurable operation and superior performance that can meet the demands of the emerging in‐memory computing remains to be explored. Here, a new type of device termed ferroelectric field‐effect memtransistor (FeFEMT) is reported, which features a multifunctional device operation scheme using the proposed multi‐terminal operability. In this device, multi‐level non‐volatile conductance switching based on the ferroelectric polarisation switching and the multidomain structure can be achieved with either gate‐ or drain‐voltage control. The device operates with control voltage inputs from both drain and gate terminals, enabling a single‐transistor structure two‐input Boolean logic‐in‐memory gate. Furthermore, the drain‐voltage controlled multidomain structure enables the FeFEMT to function as a two‐terminal synaptic transistor, showing excellent analogue conductance switching with over 7‐bit conductance states. The demonstrated synaptic properties consequently facilitate the simulation of implementation of a convolutional neural network, offering a superior inference performance. These findings highlight the prospects of the FeFEMTs as a suitable device technology for diverse and high‐efficiency in‐memory computing hardware platform.
- 24 June 2025
- Published by American Chemical Society (ACS) in Nano Letters
- Vol. 25 (26) , 10699-10708
A Programmable Nonvolatile Schottky Diode Based on van der Waals Ferroelectric Junction
Programmable and nonvolatile Schottky junctions are highly desirable for next-generation electronic and neuromorphic systems. However, conventional metal-semiconductor and even van der Waals (vdW) Schottky diodes often suffer from fixed rectifying behaviors or limited tunability. Here, we report a programmable nonvolatile ferroelectric Schottky diode based on a vdW heterojunction between semimetallic 1T'-MoTe2 and ferroelectric α-In2Se3. The diode exhibits near-ideal performance, including a rectification ratio exceeding 104, a leakage current down to 1 pA, and an ideality factor as low as 1.38. By switching ferroelectric polarization, the Schottky barrier can be modulated in a programmable manner, enabling reversible, nonvolatile, and multilevel rectification states. The device demonstrates polarization-dependent photoresponse and transient integrate-and-leak dynamics, closely resembling biological spiking neurons. A spiking neural network is implemented based on this behavior, achieving image recognition accuracy up to 98.4%. This work establishes programmable ferroelectric Schottky diodes as promising candidates for low-power memory, reconfigurable logic, and neuromorphic vision.
- 24 June 2025
- Published by American Chemical Society (ACS) in Nano Letters
- Vol. 25 (26) , 10699-10708
A Programmable Nonvolatile Schottky Diode Based on van der Waals Ferroelectric Junction
Programmable and nonvolatile Schottky junctions are highly desirable for next-generation electronic and neuromorphic systems. However, conventional metal-semiconductor and even van der Waals (vdW) Schottky diodes often suffer from fixed rectifying behaviors or limited tunability. Here, we report a programmable nonvolatile ferroelectric Schottky diode based on a vdW heterojunction between semimetallic 1T'-MoTe2 and ferroelectric α-In2Se3. The diode exhibits near-ideal performance, including a rectification ratio exceeding 104, a leakage current down to 1 pA, and an ideality factor as low as 1.38. By switching ferroelectric polarization, the Schottky barrier can be modulated in a programmable manner, enabling reversible, nonvolatile, and multilevel rectification states. The device demonstrates polarization-dependent photoresponse and transient integrate-and-leak dynamics, closely resembling biological spiking neurons. A spiking neural network is implemented based on this behavior, achieving image recognition accuracy up to 98.4%. This work establishes programmable ferroelectric Schottky diodes as promising candidates for low-power memory, reconfigurable logic, and neuromorphic vision.
- Open Access
- 2 May 2025
- Published by American Association for the Advancement of Science (AAAS) in Science Advances
- Vol. 11 (18) , eadr5337
Ultralow-pressure mechanical-motion switching of ferroelectric polarization
Ferroelectric polarization switching, achieved by mechanical forces, enables the storage of stress information in ferroelectrics and holds promise for human interface applications. The prevailing mechanical approach is locally induced flexoelectricity with large strain gradients. However, this approach usually requires huge mechanical forces, which greatly impede device applications. Here, we report an approach of using triboelectric effect to mechanically, reversibly switch ferroelectric polarization across α-In 2 Se 3 ferroelectric memristors. Through contact electrification and electrostatic induction effects, triboelectric units are used to sensitively detect mechanical forces and generate electrical voltage pulses to trigger α-In 2 Se 3 resistance switching. We realize multilevel resistance states under different mechanical forces, by which a neuromorphic stress system is demonstrated. Notably, we achieve the reversal of α-In 2 Se 3 ferroelectric polarization with a record-low mechanical force of ~10 kilopascals and even with tactile touches. Our work provides a fundamental but pragmatic strategy for creating mechanical tactile ferroelectric memory devices.
- 2 May 2025
- Published by American Association for the Advancement of Science (AAAS) in Science Advances
- Vol. 11 (18) , eadr5337
Open AccessUltralow-pressure mechanical-motion switching of ferroelectric polarization
Ferroelectric polarization switching, achieved by mechanical forces, enables the storage of stress information in ferroelectrics and holds promise for human interface applications. The prevailing mechanical approach is locally induced flexoelectricity with large strain gradients. However, this approach usually requires huge mechanical forces, which greatly impede device applications. Here, we report an approach of using triboelectric effect to mechanically, reversibly switch ferroelectric polarization across α-In 2 Se 3 ferroelectric memristors. Through contact electrification and electrostatic induction effects, triboelectric units are used to sensitively detect mechanical forces and generate electrical voltage pulses to trigger α-In 2 Se 3 resistance switching. We realize multilevel resistance states under different mechanical forces, by which a neuromorphic stress system is demonstrated. Notably, we achieve the reversal of α-In 2 Se 3 ferroelectric polarization with a record-low mechanical force of ~10 kilopascals and even with tactile touches. Our work provides a fundamental but pragmatic strategy for creating mechanical tactile ferroelectric memory devices.
- 17 April 2025
- Published by Springer Nature in Science China Information Sciences
- Vol. 68 (5) , 1-8
Ferroelectrically gated two-dimensional bismuth oxyselenides for strain-invariant flexible synaptic thin-film transistors
- 17 April 2025
- Published by Springer Nature in Science China Information Sciences
- Vol. 68 (5) , 1-8
Ferroelectrically gated two-dimensional bismuth oxyselenides for strain-invariant flexible synaptic thin-film transistors
- 11 December 2024
- Published by Wiley in Advanced Functional Materials
- Vol. 35 (13)
Reconfigurable Logic and in‐Memory Computing Based on Electrically Controlled Charge Trapping in Dielectric Engineered 2D Semiconductor Transistors
The co‐integration of logic, memory, synapse, and other essential functionalities into one single element with run‐time reconfigurability is explored as a promising approach for an efficient and flexible in‐memory computing platform. However, despite ample research focused on such reconfigurable semiconductor technology, it remains challenging to achieve a CMOS‐compatible device concept that is with simplified device structure, versatile functionalities, and efficient operation schemes. Here, a new type of run‐time electrically reconfigurable device is demonstrated based on dielectric‐engineered 2D semiconductor transistors. With an engineered semiconductor/charge‐trap layer/dielectric film heterostructure, the 2D charge‐trap transistor (CTT) resembles a simplified metal‐oxide‐semiconductor field‐effect transistor (MOSFET) structure. Both multilevel permanent charge trapping and transient voltage‐modulating capabilities can be realized in the 2D CTTs, giving rise to various switchable device function modes including non‐volatile memory, threshold voltage‐variable logic switch, and artificial synapse. Leveraging the monolithic integration of multiple 2D CTTs and time‐sequential reconfigurable operation strategy, high‐performance logic inverter and non‐volatile ternary content‐addressable memory (TCAM) with compact architecture can be created. The performance of the 2D CTTs in synapse mode is evaluated with the simulation of the convolutional neural network, showing great potential for future neuromorphic computing hardware.
- 11 December 2024
- Published by Wiley in Advanced Functional Materials
- Vol. 35 (13)
Reconfigurable Logic and in‐Memory Computing Based on Electrically Controlled Charge Trapping in Dielectric Engineered 2D Semiconductor Transistors
The co‐integration of logic, memory, synapse, and other essential functionalities into one single element with run‐time reconfigurability is explored as a promising approach for an efficient and flexible in‐memory computing platform. However, despite ample research focused on such reconfigurable semiconductor technology, it remains challenging to achieve a CMOS‐compatible device concept that is with simplified device structure, versatile functionalities, and efficient operation schemes. Here, a new type of run‐time electrically reconfigurable device is demonstrated based on dielectric‐engineered 2D semiconductor transistors. With an engineered semiconductor/charge‐trap layer/dielectric film heterostructure, the 2D charge‐trap transistor (CTT) resembles a simplified metal‐oxide‐semiconductor field‐effect transistor (MOSFET) structure. Both multilevel permanent charge trapping and transient voltage‐modulating capabilities can be realized in the 2D CTTs, giving rise to various switchable device function modes including non‐volatile memory, threshold voltage‐variable logic switch, and artificial synapse. Leveraging the monolithic integration of multiple 2D CTTs and time‐sequential reconfigurable operation strategy, high‐performance logic inverter and non‐volatile ternary content‐addressable memory (TCAM) with compact architecture can be created. The performance of the 2D CTTs in synapse mode is evaluated with the simulation of the convolutional neural network, showing great potential for future neuromorphic computing hardware.
- 5 November 2024
- Published by American Chemical Society (ACS) in ACS Photonics
- Vol. 11 (11) , 4761-4768
Reconfigurable Electro-Optic FET Based on Ferroelectric Electrostatic Doping toward Optical Field Programmable Gate Arrays
- 5 November 2024
- Published by American Chemical Society (ACS) in ACS Photonics
- Vol. 11 (11) , 4761-4768
Reconfigurable Electro-Optic FET Based on Ferroelectric Electrostatic Doping toward Optical Field Programmable Gate Arrays
- 7 August 2024
- Published by American Chemical Society (ACS) in ACS Applied Nano Materials
- Vol. 7 (16) , 19297-19304
Wide-Range Thickness Dependent Friction Behavior in 2D CuInP2S6–In4/3P2S6 Nanosheets: Implications for Tribology Applications
- 7 August 2024
- Published by American Chemical Society (ACS) in ACS Applied Nano Materials
- Vol. 7 (16) , 19297-19304
Wide-Range Thickness Dependent Friction Behavior in 2D CuInP2S6–In4/3P2S6 Nanosheets: Implications for Tribology Applications
- 14 May 2024
- Published by Springer Nature in Science China Information Sciences
- Vol. 67 (6) , 1-9
Solid-state non-volatile memories based on vdW heterostructure-based vertical-transport ferroelectric field-effect transistors
- 14 May 2024
- Published by Springer Nature in Science China Information Sciences
- Vol. 67 (6) , 1-9
Solid-state non-volatile memories based on vdW heterostructure-based vertical-transport ferroelectric field-effect transistors
- 16 April 2024
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B
- Vol. 42 (3)
Characteristics of β-(AlxGa1−x)2O3/Ga2O3 dual-metal gate modulation-doped field-effect transistors simulated by TCAD
β-(AlxGa1−x)2O3/Ga2O3 modulation-doped field-effect transistors (MODFETs) with a dual-metal gate (DMG) architecture are designed, and the electrical characteristics of the DMG device are investigated in comparison with the single-metal gate (SMG) device by the Technology Computer-Aided Design (TCAD) simulation. The results demonstrate that the DMG MODFETs possess a superior transconductance (gm), current gain cut-off frequency (fT), and power gain cut-off frequency (fMAX) than those of SMG transistors, which is attributed to the regulated channel electric field by a DMG structure. With a gate length of 0.1 μm, the peak values of fT/fMAX of the designed DMG MODFET are obtained as 48.6/50.6 GHz, respectively. Moreover, a comprehensive thermal analysis is conducted between the SMG and DMG devices under steady-state and transient conditions. The DMG MODFET exhibits a lower maximum temperature than the SMG counterpart due to the reduced channel electric field, each subjected to the same power dissipation. This finding underscores the potential of the β-(AlxGa1−x)2O3/Ga2O3 MODFET with the DMG architecture as a promising approach for high-power radio frequency operations.
- 16 April 2024
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B
- Vol. 42 (3)
Characteristics of β-(AlxGa1−x)2O3/Ga2O3 dual-metal gate modulation-doped field-effect transistors simulated by TCAD
β-(AlxGa1−x)2O3/Ga2O3 modulation-doped field-effect transistors (MODFETs) with a dual-metal gate (DMG) architecture are designed, and the electrical characteristics of the DMG device are investigated in comparison with the single-metal gate (SMG) device by the Technology Computer-Aided Design (TCAD) simulation. The results demonstrate that the DMG MODFETs possess a superior transconductance (gm), current gain cut-off frequency (fT), and power gain cut-off frequency (fMAX) than those of SMG transistors, which is attributed to the regulated channel electric field by a DMG structure. With a gate length of 0.1 μm, the peak values of fT/fMAX of the designed DMG MODFET are obtained as 48.6/50.6 GHz, respectively. Moreover, a comprehensive thermal analysis is conducted between the SMG and DMG devices under steady-state and transient conditions. The DMG MODFET exhibits a lower maximum temperature than the SMG counterpart due to the reduced channel electric field, each subjected to the same power dissipation. This finding underscores the potential of the β-(AlxGa1−x)2O3/Ga2O3 MODFET with the DMG architecture as a promising approach for high-power radio frequency operations.
- Open Access
- 26 February 2024
- Published by AIP Publishing in Applied Physics Letters
- Vol. 124 (9)
Complementary negative capacitance field-effect transistors based on vertically stacked van der Waals heterostructures
Complementary field-effect transistors (CFETs) with a vertically stacked n-FET/p-FET configuration can provide a promising solution to boost area efficiency. However, the substantial power dissipation exhibited by these CFET devices poses a notable challenge to the energy efficiency. By combining a negative-capacitance field-effect transistor (NCFET) and a CFET, the problem of excessive power consumption can be solved. By using a negative-capacitance gate stack, the supply voltage (Vdd) applied to the gate of the CFET is increased, resulting in a reduction in power consumption. Here, we experimentally demonstrate a vertically integrated complementary negative capacitance field-effect transistor (NC-CFET) that combines tungsten diselenide (WSe2) p-NCFET and molybdenum disulfide (MoS2) n-NCFET. With the hexagonal boron nitride/copper indium thiophosphate CuInP2S6 (CIPS) dielectric stack, both n-type and p-type van der Waals (vdW) NCFETs exhibit sub-60 mV/decade switching characteristics. The vdW NC-CFET exhibits a voltage gain of 78.34 and a power consumption of 129.7 pW at a supply voltage of 1 V. These device characteristics demonstrate the great potential of the vdW NC-CFET for high density and low power applications.
- 26 February 2024
- Published by AIP Publishing in Applied Physics Letters
- Vol. 124 (9)
Open AccessComplementary negative capacitance field-effect transistors based on vertically stacked van der Waals heterostructures
Complementary field-effect transistors (CFETs) with a vertically stacked n-FET/p-FET configuration can provide a promising solution to boost area efficiency. However, the substantial power dissipation exhibited by these CFET devices poses a notable challenge to the energy efficiency. By combining a negative-capacitance field-effect transistor (NCFET) and a CFET, the problem of excessive power consumption can be solved. By using a negative-capacitance gate stack, the supply voltage (Vdd) applied to the gate of the CFET is increased, resulting in a reduction in power consumption. Here, we experimentally demonstrate a vertically integrated complementary negative capacitance field-effect transistor (NC-CFET) that combines tungsten diselenide (WSe2) p-NCFET and molybdenum disulfide (MoS2) n-NCFET. With the hexagonal boron nitride/copper indium thiophosphate CuInP2S6 (CIPS) dielectric stack, both n-type and p-type van der Waals (vdW) NCFETs exhibit sub-60 mV/decade switching characteristics. The vdW NC-CFET exhibits a voltage gain of 78.34 and a power consumption of 129.7 pW at a supply voltage of 1 V. These device characteristics demonstrate the great potential of the vdW NC-CFET for high density and low power applications.