Igor Alencar
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Previous Organizations / Institutes
The organizations / institutes from the scholar's other articles in the past ten years
Igor Alencar has a total of 122 co-authors. Here are the top co-authors by number of shared publications:
J.C. Hadler
6 shared publicationsS. Guedes
6 shared publications- Carlos José Soares
Department of Operative Dentistry and Dental Materials, School of Dentistry, Federal University of Uberlândia, Uberlândia, Brazil
5 shared publications - Pedro Luis Grande
Universidade Federal do Rio Grande do Sul (UFRGS)
5 shared publications - Carlos Alberto Tello Sáenz
Universidade Estadual Paulista
4 shared publications E.A.C. Curvo
4 shared publications
Latest Publications
- 28 April 2025
- Published by Elsevier in Computer Physics Communications
- Vol. 313
PowerMEIS 3: A versatile tool for simulating ion and electron scattering
- 28 April 2025
- Published by Elsevier in Computer Physics Communications
- Vol. 313
PowerMEIS 3: A versatile tool for simulating ion and electron scattering
- 1 December 2021
- Published by Elsevier in Current Applied Physics
- Vol. 32, 91-97
Ion tracks in ultrathin polymer films: The role of the substrate
- 1 December 2021
- Published by Elsevier in Current Applied Physics
- Vol. 32, 91-97
Ion tracks in ultrathin polymer films: The role of the substrate
- 13 September 2021
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 130 (10) , 105303
Surface and subsurface damage in 14 MeV Au ion-irradiated diamond
The effects of ion irradiation on the surface and the subsurface of synthetic diamonds were characterized by using optical microscopy, atomic force microscopy, Raman spectroscopy, x-ray reflectivity, electron backscatter diffraction, and resistivity measurements. Irradiation experiments with 14 MeV ions with fluences up to ions/cm were carried out on synthetic single crystal diamonds, grown either at high pressure or by chemical vapor deposition, and on polycrystalline samples with high boron concentrations. We show that the ion irradiation-induced changes to the surface and subsurface of diamonds are rather complex and, especially in the first few nanometers, more severe than generally considered. We establish a model describing the changes in density, defect concentration, topology, crystallinity, and bonding from the surface down to the first few micrometers of the irradiated diamond.- 13 September 2021
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 130 (10) , 105303
Surface and subsurface damage in 14 MeV Au ion-irradiated diamond
The effects of ion irradiation on the surface and the subsurface of synthetic diamonds were characterized by using optical microscopy, atomic force microscopy, Raman spectroscopy, x-ray reflectivity, electron backscatter diffraction, and resistivity measurements. Irradiation experiments with 14 MeV ions with fluences up to ions/cm were carried out on synthetic single crystal diamonds, grown either at high pressure or by chemical vapor deposition, and on polycrystalline samples with high boron concentrations. We show that the ion irradiation-induced changes to the surface and subsurface of diamonds are rather complex and, especially in the first few nanometers, more severe than generally considered. We establish a model describing the changes in density, defect concentration, topology, crystallinity, and bonding from the surface down to the first few micrometers of the irradiated diamond.- Open Access
Impact Features Induced by Single Fast Ions of Different Charge-State on Muscovite Mica
The influence of the charge state q on surface modifications induced by the impact of individual fast, heavy ions on muscovite mica was investigated. Beams of 593 MeV Au with well-defined initial charge states over a relatively broad range of values (30 to 51) and at different irradiation geometries were used. At normal incidence, the impact features are rounded protrusions (hillocks) with ≳20 nm in diameter. At grazing angles, besides the hillocks, craters and elongated tails (up to 350 nm-long) extending along the direction of ion penetration are produced. It is shown that the impact features at normal incidence depend strongly on the initial charge state of the projectiles. This dependence is very weak at grazing angles as the ion reaches the equilibrium charge state closer to the surface. At normal ion incidence, the hillock volume scales with . This dependence stems largely from the increase in the hillock height, as a weak dependence of the diameter was observed.Open AccessImpact Features Induced by Single Fast Ions of Different Charge-State on Muscovite Mica
The influence of the charge state q on surface modifications induced by the impact of individual fast, heavy ions on muscovite mica was investigated. Beams of 593 MeV Au with well-defined initial charge states over a relatively broad range of values (30 to 51) and at different irradiation geometries were used. At normal incidence, the impact features are rounded protrusions (hillocks) with ≳20 nm in diameter. At grazing angles, besides the hillocks, craters and elongated tails (up to 350 nm-long) extending along the direction of ion penetration are produced. It is shown that the impact features at normal incidence depend strongly on the initial charge state of the projectiles. This dependence is very weak at grazing angles as the ion reaches the equilibrium charge state closer to the surface. At normal ion incidence, the hillock volume scales with . This dependence stems largely from the increase in the hillock height, as a weak dependence of the diameter was observed. - 14 September 2020
- Published by American Physical Society (APS) in Physical Review A
- Vol. 102 (3) , 032812
Stopping and straggling of 60–250-keV backscattered protons on nanometric Pt films
The stopping power and straggling of backscattered protons on nanometric Pt films were measured at low to medium energies (60–250 keV) by using the medium-energy ion scattering technique. The stopping power results are in good agreement with the most recent measurements by Primetzhofer Phys. Rev. B 86, 094102 (2012) and are well described by the free electron gas model at low projectile energies. Nevertheless, the straggling results are strongly underestimated by well-established formulas up to a factor of two. Alternatively, we propose a model for the energy-loss straggling that takes into account the inhomogeneous electron-gas response, based on the electron-loss function of the material, along with bunching effects. This approach yields remarkable agreement with the experimental data, indicating that the observed enhancement in energy-loss straggling is due to bunching effects in an inhomogeneous electron system. Nonlinear effects are of minor importance for the energy-loss straggling.
- 14 September 2020
- Published by American Physical Society (APS) in Physical Review A
- Vol. 102 (3) , 032812
Stopping and straggling of 60–250-keV backscattered protons on nanometric Pt films
The stopping power and straggling of backscattered protons on nanometric Pt films were measured at low to medium energies (60–250 keV) by using the medium-energy ion scattering technique. The stopping power results are in good agreement with the most recent measurements by Primetzhofer Phys. Rev. B 86, 094102 (2012) and are well described by the free electron gas model at low projectile energies. Nevertheless, the straggling results are strongly underestimated by well-established formulas up to a factor of two. Alternatively, we propose a model for the energy-loss straggling that takes into account the inhomogeneous electron-gas response, based on the electron-loss function of the material, along with bunching effects. This approach yields remarkable agreement with the experimental data, indicating that the observed enhancement in energy-loss straggling is due to bunching effects in an inhomogeneous electron system. Nonlinear effects are of minor importance for the energy-loss straggling.
- Open Access
- 1 February 2020
- Published by IOP Publishing in Materials Research Express
- Vol. 7 (2) , 025701
Elastic properties of single crystal Bi12SiO20 as a function of pressure and temperature and acoustic attenuation effects in Bi12MO20 (M = Si, Ge and Ti)
A comprehensive study of sillenite Bi12SiO20 single-crystal properties, including elastic stiffness and piezoelectric coefficients, dielectric permittivity, thermal expansion and molar heat capacity, is presented. Brillouin-interferometry measurements (up to 27 GPa), which were performed at high pressures for the first time, and ab initio calculations based on density functional theory (up to 50 GPa) show the stability of the sillenite structure in the investigated pressure range, in agreement with previous studies. Elastic stiffness coefficients c 11 and c 12 are found to increase continuously with pressure while c 44 increases slightly for lower pressures and remains nearly constant above 15 GPa. Heat-capacity measurements were performed with a quasi-adiabatic calorimeter employing the relaxation method between 2 K and 395 K. No phase transition could be observed in this temperature interval. Standard molar entropy, enthalpy change and Debye temperature are extracted from the data. The results are found to be roughly half of the previous values reported in the literature. The discrepancy is attributed to the overestimation of the Debye temperature which was extracted from high-temperature data. Additionally, Debye temperatures obtained from mean sound velocities derived by Voigt-Reuss averaging are in agreement with our heat-capacity results. Finally, a complete set of electromechanical coefficients was deduced from the application of resonant ultrasound spectroscopy between 103 K and 733 K. No discontinuities in the temperature dependence of the coefficients are observed. High-temperature (up to 1100 K) resonant ultrasound spectra recorded for Bi12 MO20 crystals revealed strong and reversible acoustic dissipation effects at 870 K, 960 K and 550 K for M = Si, Ge and Ti, respectively. Resonances with small contributions from the elastic shear stiffness c 44 and the piezoelectric stress coefficient e 123 are almost unaffected by this dissipation.
- 1 February 2020
- Published by IOP Publishing in Materials Research Express
- Vol. 7 (2) , 025701
Open AccessElastic properties of single crystal Bi12SiO20 as a function of pressure and temperature and acoustic attenuation effects in Bi12MO20 (M = Si, Ge and Ti)
A comprehensive study of sillenite Bi12SiO20 single-crystal properties, including elastic stiffness and piezoelectric coefficients, dielectric permittivity, thermal expansion and molar heat capacity, is presented. Brillouin-interferometry measurements (up to 27 GPa), which were performed at high pressures for the first time, and ab initio calculations based on density functional theory (up to 50 GPa) show the stability of the sillenite structure in the investigated pressure range, in agreement with previous studies. Elastic stiffness coefficients c 11 and c 12 are found to increase continuously with pressure while c 44 increases slightly for lower pressures and remains nearly constant above 15 GPa. Heat-capacity measurements were performed with a quasi-adiabatic calorimeter employing the relaxation method between 2 K and 395 K. No phase transition could be observed in this temperature interval. Standard molar entropy, enthalpy change and Debye temperature are extracted from the data. The results are found to be roughly half of the previous values reported in the literature. The discrepancy is attributed to the overestimation of the Debye temperature which was extracted from high-temperature data. Additionally, Debye temperatures obtained from mean sound velocities derived by Voigt-Reuss averaging are in agreement with our heat-capacity results. Finally, a complete set of electromechanical coefficients was deduced from the application of resonant ultrasound spectroscopy between 103 K and 733 K. No discontinuities in the temperature dependence of the coefficients are observed. High-temperature (up to 1100 K) resonant ultrasound spectra recorded for Bi12 MO20 crystals revealed strong and reversible acoustic dissipation effects at 870 K, 960 K and 550 K for M = Si, Ge and Ti, respectively. Resonances with small contributions from the elastic shear stiffness c 44 and the piezoelectric stress coefficient e 123 are almost unaffected by this dissipation.
- 1 December 2019
- Published by Elsevier in Thin Solid Films
- Vol. 692, 137536
Profiling As plasma doped Si/SiO2 with molecular ions
- 1 December 2019
- Published by Elsevier in Thin Solid Films
- Vol. 692, 137536
Profiling As plasma doped Si/SiO2 with molecular ions
- Open Access
- 12 August 2019
- Published by Springer Nature in Scientific Reports
- Vol. 9 (1) , 1-7
Unraveling structural and compositional information in 3D FinFET electronic devices
Non-planar Fin Field Effect Transistors (FinFET) are already present in modern devices. The evolution from the well-established 2D planar technology to the design of 3D nanostructures rose new fabrication processes, but a technique capable of full characterization, particularly their dopant distribution, in a representative (high statistics) way is still lacking. Here we propose a methodology based on Medium Energy Ion Scattering (MEIS) to address this query, allowing structural and compositional quantification of advanced 3D FinFET devices with nanometer spatial resolution. When ions are backscattered, their energy losses unfold the chemistry of the different 3D compounds present in the structure. The FinFET periodicity generates oscillatory features as a function of backscattered ion energy and, in fact, these features allow a complete description of the device dimensions. Additionally, each measurement is performed over more than thousand structures, being highly representative in a statistical meaning. Finally, independent measurements using electron microscopy corroborate the proposed methodology.
- 12 August 2019
- Published by Springer Nature in Scientific Reports
- Vol. 9 (1) , 1-7
Open AccessUnraveling structural and compositional information in 3D FinFET electronic devices
Non-planar Fin Field Effect Transistors (FinFET) are already present in modern devices. The evolution from the well-established 2D planar technology to the design of 3D nanostructures rose new fabrication processes, but a technique capable of full characterization, particularly their dopant distribution, in a representative (high statistics) way is still lacking. Here we propose a methodology based on Medium Energy Ion Scattering (MEIS) to address this query, allowing structural and compositional quantification of advanced 3D FinFET devices with nanometer spatial resolution. When ions are backscattered, their energy losses unfold the chemistry of the different 3D compounds present in the structure. The FinFET periodicity generates oscillatory features as a function of backscattered ion energy and, in fact, these features allow a complete description of the device dimensions. Additionally, each measurement is performed over more than thousand structures, being highly representative in a statistical meaning. Finally, independent measurements using electron microscopy corroborate the proposed methodology.