Lucas Atila Bernardes Marçal

Metal halide perovskites generally present functional properties such as ferroelectricity and ferroelasticity, forming nano domains which dictate most of their physical properties. Crystalline changes in the nanoscale, including heat-induced domain rearrangements, are generally responsible for the appearance of structural defects. This is valid for bulk and surface but is especially relevant in nanomaterials, where charge traps lead to degradation in perovskites, reducing the lifetime and compromising their use in solar cells. The growth of oriented nano domains, on the other hand, does not only improve perovskite-based solar cells efficiency and lifetime, but can be potentially used to tailor conductivity and optical emission, opening new possibilities for applications in optoelectronic devices. Studying phase transitions, defect formation and nano domain dynamics in perovskites is challenging, requiring techniques capable of probing crystals with high strain sensitivity and good spatial resolution. In situ and operando experiments, for instance, are difficult to perform using traditional techniques which require severe sample preparation. Recent developments in synchrotron x-ray sources, with the emergence of instruments able to offer small x-ray beams with improved photon flux and coherence, can bring new insights into the field. This review focuses on x-ray methods for the study of perovskite basic properties, enlightening possible multi-technique experiments which are currently available in large scale facilities.

Over the last years metal halide perovskites have demonstrated remarkable potential for integration in light emitting devices. Heterostructures allow for tunable bandgap depending on the local anion composition, crucial for optoelectronic devices, but local structural effects of anion exchange in single crystals is not fully understood. Here, we investigate how the anion exchange of CsPbBr₃ nanowires fully and locally exposed to HCl vapor affects the local crystal structure, using nanofocused x-rays. We study the nanoscale composition and crystal structure as function of HCl exposure time and demonstrate the correlation of anion exchange with changes in the lattice parameter. The local composition was measured by x-ray fluorescence and x-ray diffraction, with general agreement of both methods but with much less variation using latter. The heterostructured nanowires exhibit unintentional gradients in composition, both axially and radially. Ferroelastic domains are observed for all HCl exposure times, and the magnitude of the lattice tilt at the domain walls scales with the Cl concentration.

Developing semiconductor devices requires a fast and reliable source of strain information with high spatial resolution and strain sensitivity. This work investigates the strain in an axially heterostructured 180 nm-diameter GaInP nanowire with InP segments of varying lengths down to 9 nm, simultaneously probing both materials. Scanning X-ray diffraction (XRD) is compared with Bragg projection ptychography (BPP), a fast single-projection method. BPP offers a sufficient spatial resolution to reveal fine details within the largest segments, unlike scanning XRD. The spatial resolution affects the quantitative accuracy of the strain maps, where BPP shows much-improved agreement with an elastic 3D finite element model compared with scanning XRD. The sensitivity of BPP to small deviations from the Bragg condition is systematically investigated. The experimental confirmation of the model suggests that the large lattice mismatch of 1.52% is accommodated without defects.

Metal halide perovskites (MHPs) have garnered significant interest as promising candidates for nanoscale optoelectronic applications due to their excellent optical properties. Axially heterostructured CsPbBr₃-CsPb(Br_(1-x)Cl_x)₃ nanowires can be produced by localized anion exchange of pregrown CsPbBr₃ nanowires. However, characterizing such heterostructures with sufficient strain and real space resolution is challenging. Here, we use nanofocused scanning X-ray diffraction (XRD) and X-ray fluorescence (XRF) with a 60 nm beam to investigate a heterostructured MHP nanowire as well as a reference CsPbBr₃ nanowire. The nano-XRD approach gives spatially resolved maps of composition, lattice spacing, and lattice tilt. Both the reference and exchanged nanowire show signs of diverse types of ferroelastic domains, as revealed by the tilt maps. The chlorinated segment shows an average Cl composition of x = 66 and x = 70% as measured by XRD and XRF, respectively. The XRD measurements give a much more consistent result than the XRF ones. These findings are consistent with photoluminescence measurements, showing x = 73%. The nominally unexchanged segment also has a small concentration of Cl, as observed with all three methods, which we attribute to diffusion after processing. These results highlight the need to prevent such unwanted processes in order to fabricate optoelectronic devices based on MHP heterostructures.

Investigations on epitaxial nanostructures with size of tens of nanometers have been a challenging issue for techniques that present high strain sensitivity but restricted spatial resolution. This is the case of recently developed x-ray nanoprobe techniques. Despite its inherent nondestructive character, submicron x-ray spots have only been successfully applied to the study of individual nanostructures which are either strain free or present extremely mild spatial lattice parameter gradients. Such limitation, with an uttermost barrier given by the diffraction limit, leads to voxel or pixel sizes between 5 and 10 nm obtained in coherent diffraction imaging or ptychographic reconstructions of real-space objects. Whenever the strain field of a nanostructure is successfully reconstructed from reciprocal space measurements, it cannot vary considerably in short distances since this would induce diffraction peak broadening and cause abrupt phase variations, leading to convergence issues on reconstruction algorithms. Here we show how epitaxial systems with large lattice mismatch and appreciable interfacial strain can be identified and directly analyzed throughout their strain field propagation in nanometer-thin crystalline membrane platforms, using the InGaAs/GaAs Stranski-Krastanov system as a model. The strain-induced footprint becomes observable along a few microns if the membrane thickness is comparable to the nanostructure size. It is possible to retrieve both interfacial strain and nanostructure size by probing individual objects.

Strain and interactions at grain boundaries during solid-phase crystallization are known to play a significant role in the functional properties of polycrystalline materials. However, elucidating three-dimensional nanoscale grain morphology, kinetics, and strain under realistic conditions is challenging. Here, we image a single-grain growth during the amorphous-to-polycrystalline transition in technologically relevant transparent conductive oxide film of In₂O₃:Zr with in situ Bragg coherent X-ray diffraction imaging and transmission electron microscopy. We find that the Johnson-Mehl-Avrami-Kolmogorov theory, which describes the average kinetics of polycrystalline films growth, can be applied to the single grains as well. The quantitative analysis stems directly from imaging results. We elucidate the interface-controlled nature of the single-grain growth in thin films and reveal the surface strains which may be a driving force for anisotropic crystallization rates. Our results bring in situ imaging with coherent X-rays towards understanding and controlling the crystallization processes of transparent conductive oxides and other polycrystalline materials at the nanoscale.