Qing-Qing Meng
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Qing-Qing Meng has a total of 5 co-authors. Here are the top co-authors by number of shared publications:
- Chengyou Lin
College of Mathematics and Physics, Beijing University of Chemical Technology, Beijing 100029, China
1 shared publication - Shujing Chen
School of Materials Science and Technology, China University of Geosciences, Beijing, China
1 shared publication - Xin Zhao
College of Science, Beijing University of Chemical Technology, Beijing 100029, China
1 shared publication - Yingchun Ding
College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029, China
1 shared publication - Zhaoyang Chen
College of Mathematics and Physics, Beijing University of Chemical Technology, Beijing, People’s Republic of China
1 shared publication
Latest Publications
- Open Access
Figure of Merit Enhancement of a Surface Plasmon Resonance Sensor Using a Low-Refractive-Index Porous Silica Film
In this paper; the surface plasmon resonance (SPR) sensor with a porous silica film was studied. The effect of the thickness and porosity of the porous silica film on the performance of the sensor was analyzed. The results indicated that the figure of merit (FOM) of an SPR sensor can be enhanced by using a porous silica film with a low-refractive-index. Particularly; the FOM of an SPR sensor with 40 nm thick 90% porosity porous silica film; whose refractive index is 1.04 was improved by 311% when compared with that of a traditional SPR sensor. Furthermore; it was found that the decrease in the refractive index or the increase in the thickness of the low-refractive-index porous silica film can enlarge the FOM enhancement. It is believed that the proposed SPR sensor with a low-refractive-index porous silica film will be helpful for high-performance SPR sensors development.
Open AccessFigure of Merit Enhancement of a Surface Plasmon Resonance Sensor Using a Low-Refractive-Index Porous Silica Film
In this paper; the surface plasmon resonance (SPR) sensor with a porous silica film was studied. The effect of the thickness and porosity of the porous silica film on the performance of the sensor was analyzed. The results indicated that the figure of merit (FOM) of an SPR sensor can be enhanced by using a porous silica film with a low-refractive-index. Particularly; the FOM of an SPR sensor with 40 nm thick 90% porosity porous silica film; whose refractive index is 1.04 was improved by 311% when compared with that of a traditional SPR sensor. Furthermore; it was found that the decrease in the refractive index or the increase in the thickness of the low-refractive-index porous silica film can enlarge the FOM enhancement. It is believed that the proposed SPR sensor with a low-refractive-index porous silica film will be helpful for high-performance SPR sensors development.