Bin Nie

As Graphics Processing Units (GPUs) are becoming a de facto solution for accelerating a wide range of applications, their reliable operation is becoming increasingly important. One of the major challenges in the domain of GPU reliability is to accurately measure GPGPU application error resilience. This challenge stems from the fact that a typical GPGPU application spawns a huge number of threads and then utilizes a large amount of potentially unreliable compute and memory resources available on the GPUs. As the number of possible fault locations can be in the billions, evaluating every fault and examining its effect on the application error resilience is impractical. Application resilience is evaluated via extensive fault injection campaigns based on sampling of an extensive fault site space. Typically, the larger the input of the GPGPU application, the longer the experimental campaign. In this work, we devise a methodology, SUGAR (Speeding Up G PGPU Application Resilience Estimation with input sizing), that dramatically speeds up the evaluation of GPGPU application error resilience by judicious input sizing. We show how analyzing a small fraction of the input is sufficient to estimate the application resilience with high accuracy and dramatically reduce the duration of experimentation. Key to our estimation methodology is the discovery of repeating patterns as a function of the input size. Using the well-established fact that error resilience in GPGPU applications is mostly determined by the dynamic instruction (DI) count at the thread level, we discover the patterns that allow to accurately predict application error resilience for arbitrarily large inputs. For the cases that we examine in this paper, this new resilience estimation provides significant speedups (up to 1336 times) and 97.0 on the average, while keeping estimation errors to less than 1%, for details see the full version of this SIGMETRICS paper.

Graphics Processing Units (GPUs) have rapidly evolved to enable energy-efficient data-parallel computing for a broad range of scientific areas. While GPUs achieve exascale performance at a stringent power budget, they are also susceptible to soft errors, often caused by high-energy particle strikes, that can significantly affect the application output quality. Understanding the resilience of general purpose GPU (GPGPU) applications is especially challenging because unlike CPU applications, which are mostly single-threaded, GPGPU applications can contain hundreds to thousands of threads, resulting in a tremendously large fault site space in the order of billions, even for some simple applications and even when considering the occurrence of just a single-bit fault. We present a systematic way to progressively prune the fault site space aiming to dramatically reduce the number of fault injections such that assessment for GPGPU application error resilience becomes practical. The key insight behind our proposed methodology stems from the fact that while GPGPU applications spawn a lot of threads, many of them execute the same set of instructions. Therefore, several fault sites are redundant and can be pruned by careful analysis. We identify important features across a set of 10 applications (16 kernels) from Rodinia and Polybench suites and conclude that threads can be primarily classified based on the number of the dynamic instructions they execute. We therefore achieve significant fault site reduction by analyzing only a small subset of threads that are representative of the dynamic instruction behavior (and therefore error resilience behavior) of the GPGPU applications. Further pruning is achieved by identifying the dynamic instruction commonalities (and differences) across code blocks within this representative set of threads, a subset of loop iterations within the representative threads, and a subset of destination register bit positions. The above steps result in a tremendous reduction of fault sites by up to seven orders of magnitude. Yet, this reduced fault site space accurately captures the error resilience profile of GPGPU applications. We show the effectiveness of the proposed progressive pruning technique for a single-bit model and illustrate its application to even more challenging cases with three distinct multi-bit fault models.