Datai Hui
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Datai Hui has a total of 11 co-authors. Here are the top co-authors by number of shared publications:
- Bo Lu
Institute of Thin Film, Sensors and Imaging, School of Computing, Engineering and Physical Sciences, University of the West of Scotland, Paisley G72 0LH, UK
1 shared publication - Changlong Cai
School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, China
1 shared publication - Da Zhang
School of Opto-Electronical Engineering, Xi’an Technological University, Xi’an 710021, China
1 shared publication - Des Gibson
University of the West of Scotland
1 shared publication - Hayrigul Tursun
School of Physics and Information Technology, Shaanxi Normal University, Xi’an 710062, China
1 shared publication - Jian Song
School of Computing, Engineering and Physical Sciences, University of the West of Scotland, Paisley PA1 2BE, Scotland, UK
1 shared publication
Latest Publications
- Open Access
Modeling and Experimental Investigations of Nanostructured Ag Thin Films Produced by Oblique-Angle Deposition and Its SERS Performance
The growth mechanism of nanocolumnar silver thin film deposited on a smooth silicon substrate using electron beam evaporation process at an oblique angle was simulated with the Kinetic Monte Carlo method. Following the simulated silver nanostructured thin film, a further computational simulation was done using COMSOL for surface-enhanced Raman scattering effects. The simulation results were compared against corresponding experimental results, which demonstrated high agreement between simulation results and experimental data. It was found that as the incident deposition angle increased, the density of the Ag thin film significantly decreased and the surface roughness increased. When the incident deposition angle was at 75° and 85°, the resulting nanocolumnar structure was significantly tilted. For Ag thin films deposited at all investigated angles, surface-enhanced Raman scattering effects were observed. Particularly, the Ag nanocolumns deposited at 85° showed remarkable Surface-enhanced Raman Scattering effects. This was seen in both COMSOL simulations and experimental results: Enhancement factors were 2 × 107 in COMSOL simulation and 3.3 × 105 in the experiment.
Open AccessModeling and Experimental Investigations of Nanostructured Ag Thin Films Produced by Oblique-Angle Deposition and Its SERS Performance
The growth mechanism of nanocolumnar silver thin film deposited on a smooth silicon substrate using electron beam evaporation process at an oblique angle was simulated with the Kinetic Monte Carlo method. Following the simulated silver nanostructured thin film, a further computational simulation was done using COMSOL for surface-enhanced Raman scattering effects. The simulation results were compared against corresponding experimental results, which demonstrated high agreement between simulation results and experimental data. It was found that as the incident deposition angle increased, the density of the Ag thin film significantly decreased and the surface roughness increased. When the incident deposition angle was at 75° and 85°, the resulting nanocolumnar structure was significantly tilted. For Ag thin films deposited at all investigated angles, surface-enhanced Raman scattering effects were observed. Particularly, the Ag nanocolumns deposited at 85° showed remarkable Surface-enhanced Raman Scattering effects. This was seen in both COMSOL simulations and experimental results: Enhancement factors were 2 × 107 in COMSOL simulation and 3.3 × 105 in the experiment.