Yu Cui
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Yu Cui has a total of 9 co-authors. Here are the top co-authors by number of shared publications:
- Cheng Hou
Faculty of Mechanical and Electrical Engineering, and Yunnan Key Laboratory of Intelligent Control and Application, Kunming University of Science and Technology, Kunming, China
2 shared publications - Guanbin Gao
Kunming University of Science and Technology
2 shared publications - Jing Na
Kunming University of Science and Technology
2 shared publications - Sen Wang
Kunming University of Science and Technology
2 shared publications Binzhou Xiong
Faculty of Mechanical and Electrical Engineering Kunming University of Science and Technology Kunming China
1 shared publication- Haibo Wu
Kunming University of Science and Technology
1 shared publication
Latest Publications
- 5 November 2025
- Published by Elsevier in Measurement
- Vol. 259
Vision-guided robotic measurement: Robust trajectory extraction for contact probing in visually degraded environments
- 5 November 2025
- Published by Elsevier in Measurement
- Vol. 259
Vision-guided robotic measurement: Robust trajectory extraction for contact probing in visually degraded environments
- 19 April 2021
- Published by Wiley in Journal of the Society for Information Display
- Vol. 29 (7) , 547-560
Liquid crystal display defects in multiple backgrounds with visual real‐time detection
There are kinds of defects that may appear in the process of Liquid Crystal Display (LCD) manufacturing, which cannot be effectively detected, owing to the uneven illumination, low contrast, and miscellaneous patterns of defects. To improve the efficiency of defect detection and ensure the quality of LCD, three visual real‐time detection methods are adopted for detecting six different defects in multiple backgrounds, where image preprocessing methods are used to highlight the defects and facilitate the segmentation and detection. Specifically, the interclass variance (OTSU) method is used to segment and mark Liquid Crystal Display (LCD) Mura and scratch defects in six kinds of solid color backgrounds; the method and the connectivity‐4 judgment criteria are adopted to label edge defects in grid display background; the gray mean and standard deviation of the segmented subregions are calculated to recognize the color gradation defect in the 32‐level gradation display background. Experimental results show that LCD Mura defects and scratches can be segmented more completely by the proposed method compared with the benchmark methods, and the edge defects can be identified accurately by the OTSU‐based method and particle‐based morphological processing with grids as the detection background, and the color gradation can also be recognized with the 32‐level gray gradation as the background.
- 19 April 2021
- Published by Wiley in Journal of the Society for Information Display
- Vol. 29 (7) , 547-560
Liquid crystal display defects in multiple backgrounds with visual real‐time detection
There are kinds of defects that may appear in the process of Liquid Crystal Display (LCD) manufacturing, which cannot be effectively detected, owing to the uneven illumination, low contrast, and miscellaneous patterns of defects. To improve the efficiency of defect detection and ensure the quality of LCD, three visual real‐time detection methods are adopted for detecting six different defects in multiple backgrounds, where image preprocessing methods are used to highlight the defects and facilitate the segmentation and detection. Specifically, the interclass variance (OTSU) method is used to segment and mark Liquid Crystal Display (LCD) Mura and scratch defects in six kinds of solid color backgrounds; the method and the connectivity‐4 judgment criteria are adopted to label edge defects in grid display background; the gray mean and standard deviation of the segmented subregions are calculated to recognize the color gradation defect in the 32‐level gradation display background. Experimental results show that LCD Mura defects and scratches can be segmented more completely by the proposed method compared with the benchmark methods, and the edge defects can be identified accurately by the OTSU‐based method and particle‐based morphological processing with grids as the detection background, and the color gradation can also be recognized with the 32‐level gray gradation as the background.