Junlan Wang
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Previous Organizations / Institutes
The organizations / institutes from the scholar's other articles in the past ten years
Research Subjects
Junlan Wang has a total of 122 co-authors. Here are the top co-authors by number of shared publications:
- Christopher M. Lew
Chevron Technical Center, Richmond, California 94801, United States
8 shared publications Minwei Sun
Department of Chemical and Environmental Engineering, University of California, Riverside, Riverside, California 92521, United States
8 shared publications- Yushan Yan
University of Delaware
8 shared publications Yan Liu
Department of Chemical and Environmental Engineering, University of California, Riverside, Riverside, California 92521, United States
7 shared publicationsJie Lian
6 shared publicationsYushan Yan
6 shared publications
Latest Publications
- Open Access
- 19 October 2026
- Published by Springer Nature in Experimental Mechanics
- Vol. 66 (9) , 1457-1458
A Year-End Reflection from the Editor-in-Chief
- 19 October 2026
- Published by Springer Nature in Experimental Mechanics
- Vol. 66 (9) , 1457-1458
Open AccessA Year-End Reflection from the Editor-in-Chief
- Open Access
- 24 October 2025
- Published by Springer Nature in Experimental Mechanics
- Vol. 65 (9) , 1359
A Year-End Reflection from the Editor-in-Chief
- 24 October 2025
- Published by Springer Nature in Experimental Mechanics
- Vol. 65 (9) , 1359
Open AccessA Year-End Reflection from the Editor-in-Chief
- Open Access
- 3 January 2025
- Published by Springer Nature in Experimental Mechanics
- Vol. 65 (1) , 3
Editorial: Message from the Incoming Editor-in-Chief
- 3 January 2025
- Published by Springer Nature in Experimental Mechanics
- Vol. 65 (1) , 3
Open AccessEditorial: Message from the Incoming Editor-in-Chief
- Open Access
Mechanical Properties of Thermally Annealed Cu/Ni and Cu/Al Multilayer Thin Films: Solid Solution vs. Intermetallic Strengthening
In this study, Cu/Ni and Cu/Al multilayers, with individual layer thickness varying from 25 nm to 200 nm, and co-sputtered Cu-Ni and Cu-Al single layer films were deposited at room temperature via magnetron sputtering and further annealed from 100 °C to 300 °C. The mechanical and microstructural properties of the as-deposited and annealed samples were characterized by nanoindentation, x-ray diffraction, and scanning electron microscopy. Both multilayer systems exhibit an increase in hardness with increasing annealing temperature. However, the Cu/Ni system shows a gradual and moderate hardness increase (up to 30%) from room temperature to 300 °C, while the Cu/Al system displays a sharp hardness surge (~150%) between 125 °C and 200 °C. The co-sputtered Cu-Ni and Cu-Al samples consistently demonstrate higher hardness than their multilayered counterparts, albeit with distinctly different temperature dependence—the hardness of Cu-Ni increases with annealing temperature while Cu-Al maintains a constant high hardness throughout the entire temperature range. The distinct thermal strengthening mechanisms observed in the two metallic multilayer systems can be ascribed to the formation of solid solutions in Cu/Ni and the precipitation of intermetallic phases in Cu/Al. This study highlights the unique advantage of intermetallic strengthening in metallic multilayer systems.
Open AccessMechanical Properties of Thermally Annealed Cu/Ni and Cu/Al Multilayer Thin Films: Solid Solution vs. Intermetallic Strengthening
In this study, Cu/Ni and Cu/Al multilayers, with individual layer thickness varying from 25 nm to 200 nm, and co-sputtered Cu-Ni and Cu-Al single layer films were deposited at room temperature via magnetron sputtering and further annealed from 100 °C to 300 °C. The mechanical and microstructural properties of the as-deposited and annealed samples were characterized by nanoindentation, x-ray diffraction, and scanning electron microscopy. Both multilayer systems exhibit an increase in hardness with increasing annealing temperature. However, the Cu/Ni system shows a gradual and moderate hardness increase (up to 30%) from room temperature to 300 °C, while the Cu/Al system displays a sharp hardness surge (~150%) between 125 °C and 200 °C. The co-sputtered Cu-Ni and Cu-Al samples consistently demonstrate higher hardness than their multilayered counterparts, albeit with distinctly different temperature dependence—the hardness of Cu-Ni increases with annealing temperature while Cu-Al maintains a constant high hardness throughout the entire temperature range. The distinct thermal strengthening mechanisms observed in the two metallic multilayer systems can be ascribed to the formation of solid solutions in Cu/Ni and the precipitation of intermetallic phases in Cu/Al. This study highlights the unique advantage of intermetallic strengthening in metallic multilayer systems.
- Open Access
- 3 January 2024
- Published by MDPI AG in Preprints.org
Mechanical Properties of Thermally Annealed Cu/Ni and Cu/Al Multilayer Thin Films: Solid Solution vs Intermetallic Strengthening
In this study, Cu/Ni and Cu/Al multilayer thin films with individual layer thickness varying from 25 nm to 200 nm were deposited at room temperature and further annealed up to 300 ℃. The mechanical and microstructural properties of the multilayers were characterized by nanoindentation, x-ray diffraction, and scanning electron microscopy. Both systems exhibited an increase in hardness with increasing annealing temperature. However, the Cu/Ni system showed a gradual and moderate (up to 30%) hardness increase from room temperature to 300 ℃, while the Cu/Al system showed a sharp increase (~150%) between 125℃ and 200℃. This distinct strengthening behavior is attributed to solid solution formation in Cu/Ni and diffusion-activated intermetallic formation in Cu/Al.
- 3 January 2024
- Published by MDPI AG in Preprints.org
Open AccessMechanical Properties of Thermally Annealed Cu/Ni and Cu/Al Multilayer Thin Films: Solid Solution vs Intermetallic Strengthening
In this study, Cu/Ni and Cu/Al multilayer thin films with individual layer thickness varying from 25 nm to 200 nm were deposited at room temperature and further annealed up to 300 ℃. The mechanical and microstructural properties of the multilayers were characterized by nanoindentation, x-ray diffraction, and scanning electron microscopy. Both systems exhibited an increase in hardness with increasing annealing temperature. However, the Cu/Ni system showed a gradual and moderate (up to 30%) hardness increase from room temperature to 300 ℃, while the Cu/Al system showed a sharp increase (~150%) between 125℃ and 200℃. This distinct strengthening behavior is attributed to solid solution formation in Cu/Ni and diffusion-activated intermetallic formation in Cu/Al.
- 7 August 2023
- Published by Wiley in Journal of Applied Mechanics
- Vol. 90 (12) , 1-35
Correlation of Microstructure and Nanomechanical Properties of Additively Manufactured Inconel 718
Additive manufacturing (AM) has emerged as a crucial technology in recent decades, particularly within the aerospace industry. However, the thermally cyclic nature of these processes introduces significant variations and defects in microstructure, which can adversely affect final part performance and hinder the widespread adoption of the technology. Traditionally, characterization of AM parts has relied on conventional bulk testing methods, which involve analyzing many samples to gather sufficient data for statistical analysis. Unfortunately, these methods are unable to account for local nanoscale variations in material properties caused by the microstructure, as they measure a single averaged property for each tested sample. In this work, we use AM Inconel 718 as a model system in developing a novel approach to correlate nanomechanical properties obtained through nanoindentation with microstructure obtained through electron backscatter diffraction (EBSD). By associating mechanical properties obtained from each indent with the corresponding crystallographic direction, we calculate the weighted average hardness and modulus for each orientation. This enables us to generate inverse pole figure maps depicting the relationship between mechanical properties and crystallographic direction. Our method yields results in good agreement with literature when calculating the part modulus and hardness, while effectively capturing nanoscale variations in properties across the microstructure. The key advantage of this methodology is its capability to rapidly test a single AM part and generate a large dataset for statistical analysis. Complementing existing macroscale characterization techniques, this method can help improve AM part performance prediction and contribute to the wider adoption of AM technologies in the future.
- 7 August 2023
- Published by Wiley in Journal of Applied Mechanics
- Vol. 90 (12) , 1-35
Correlation of Microstructure and Nanomechanical Properties of Additively Manufactured Inconel 718
Additive manufacturing (AM) has emerged as a crucial technology in recent decades, particularly within the aerospace industry. However, the thermally cyclic nature of these processes introduces significant variations and defects in microstructure, which can adversely affect final part performance and hinder the widespread adoption of the technology. Traditionally, characterization of AM parts has relied on conventional bulk testing methods, which involve analyzing many samples to gather sufficient data for statistical analysis. Unfortunately, these methods are unable to account for local nanoscale variations in material properties caused by the microstructure, as they measure a single averaged property for each tested sample. In this work, we use AM Inconel 718 as a model system in developing a novel approach to correlate nanomechanical properties obtained through nanoindentation with microstructure obtained through electron backscatter diffraction (EBSD). By associating mechanical properties obtained from each indent with the corresponding crystallographic direction, we calculate the weighted average hardness and modulus for each orientation. This enables us to generate inverse pole figure maps depicting the relationship between mechanical properties and crystallographic direction. Our method yields results in good agreement with literature when calculating the part modulus and hardness, while effectively capturing nanoscale variations in properties across the microstructure. The key advantage of this methodology is its capability to rapidly test a single AM part and generate a large dataset for statistical analysis. Complementing existing macroscale characterization techniques, this method can help improve AM part performance prediction and contribute to the wider adoption of AM technologies in the future.
- 7 August 2023
- Published by Wiley in Journal of Applied Mechanics
- Vol. 90 (12) , 1-19
Deposition Temperature Induced Texture and Strengthening of Ti/Ni Multilayer Thin Films
Strong thermal effect on microstructure and mechanical properties of Ti/Ni multilayer thin films was observed from in situ heating during deposition and subsequent annealing. Films deposited at low-temperature show preferred crystallographic texture for both Ti and Ni layers, with columnar structure extending through the layers. The columnar structure becomes more distinct and complete with the increase of temperature up to 300 °C, and meanwhile, more atomic diffusion and intermixing occur along the Ti/Ni interfaces, promoting the formation of Ti-Ni intermetallic precipitates. High-temperature deposition causes disintegration of the layered structure. Columnar Ti-Ni alloys and further recrystallized alloys were detected with the preferred crystallographic texture. For material strength, an increased hardness trend was observed with increasing deposition temperature even with much larger grain size compared to room temperature case. Furthermore, for multilayer systems deposited under low temperature, post-annealing resulted in higher hardness with minimal microstructure modification, with more strengthening observed in lower deposition temperature case.
- 7 August 2023
- Published by Wiley in Journal of Applied Mechanics
- Vol. 90 (12) , 1-19
Deposition Temperature Induced Texture and Strengthening of Ti/Ni Multilayer Thin Films
Strong thermal effect on microstructure and mechanical properties of Ti/Ni multilayer thin films was observed from in situ heating during deposition and subsequent annealing. Films deposited at low-temperature show preferred crystallographic texture for both Ti and Ni layers, with columnar structure extending through the layers. The columnar structure becomes more distinct and complete with the increase of temperature up to 300 °C, and meanwhile, more atomic diffusion and intermixing occur along the Ti/Ni interfaces, promoting the formation of Ti-Ni intermetallic precipitates. High-temperature deposition causes disintegration of the layered structure. Columnar Ti-Ni alloys and further recrystallized alloys were detected with the preferred crystallographic texture. For material strength, an increased hardness trend was observed with increasing deposition temperature even with much larger grain size compared to room temperature case. Furthermore, for multilayer systems deposited under low temperature, post-annealing resulted in higher hardness with minimal microstructure modification, with more strengthening observed in lower deposition temperature case.
- 9 August 2021
- Published by Springer Nature in Experimental Mechanics
- Vol. 62 (1) , 49-58
Engineering the Interface: Effects of Interfacial Adhesion and Substrate Thickness on the Ductility of Polymer-supported Metal Films
- 9 August 2021
- Published by Springer Nature in Experimental Mechanics
- Vol. 62 (1) , 49-58
Engineering the Interface: Effects of Interfacial Adhesion and Substrate Thickness on the Ductility of Polymer-supported Metal Films
- Open Access
- 28 March 2019
- Published by Springer Nature in Experimental Mechanics
- p. 1-10
Correction to: Residual Stresses in Cu/Ni Multilayer Thin Films Measured Using the Sin2ψ Method
- 28 March 2019
- Published by Springer Nature in Experimental Mechanics
- p. 1-10
Open AccessCorrection to: Residual Stresses in Cu/Ni Multilayer Thin Films Measured Using the Sin2ψ Method