Zhaoyang Wang
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Previous Organizations / Institutes
The organizations / institutes from the scholar's other articles in the past ten years
Zhaoyang Wang has a total of 17 co-authors. Here are the top co-authors by number of shared publications:
- Haiyong Chen
School of Artificial Intelligence, Hebei University of Technology, Tianjin, China
4 shared publications - Xinwei Lv
School of Artificial Intelligence, Hebei University of Technology
3 shared publications - Amal Altaezi
Hebei university of Technology
1 shared publication - Beilun Wang
Southeast University, Nanjing, China
1 shared publication - Binyi Su
Hebei university of Technology
1 shared publication - Binyi Su
School of Artificial Intelligence and Data Science, Hebei University of Technology, Tianjin, China
1 shared publication
Latest Publications
- 22 September 2026
- Published by Springer Nature
- p. 55-73
FuDU: A Fuzzy Dual-Dimensional Uncertainty Framework for Streaming Active Learning in Industrial Defect Detection
- 22 September 2026
- Published by Springer Nature
- p. 55-73
FuDU: A Fuzzy Dual-Dimensional Uncertainty Framework for Streaming Active Learning in Industrial Defect Detection
- 9 May 2026
- Published by Elsevier in Solar Energy
- Vol. 314
Diagnostics in multi-line photovoltaic module manufacturing using electroluminescence-based unsupervised anomaly detection
- 9 May 2026
- Published by Elsevier in Solar Energy
- Vol. 314
Diagnostics in multi-line photovoltaic module manufacturing using electroluminescence-based unsupervised anomaly detection
- 17 February 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
- Vol. 39 (2) , 372-374
Cross Domain Anomaly Detection in Semiconductor Manufacturing via Projection Comparison and Reconstruction in Latent Space
Photovoltaic wafer manufacturing demands near-zero defects, yet anomaly detection models often fail to generalize across manufacturing lines due to domain shift caused by varying imaging devices and process conditions. This letter presents Projection Comparison and Reconstruction (PCR), a framework for cross-domain anomaly detection. Patch-based Domain Fusion mixes source and target images via grid-wise stochastic patch replacement, explicitly increasing cross-domain distribution overlap. Dual-Teacher Knowledge Distillation combines a frozen domain-agnostic teacher with a trainable adaptive teacher to obtain domain-invariant features for robust reconstruction. PCR achieves state-of-the-art performance, including an 8.07-point image-level AUROC gain on ELAD.
- 17 February 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
- Vol. 39 (2) , 372-374
Cross Domain Anomaly Detection in Semiconductor Manufacturing via Projection Comparison and Reconstruction in Latent Space
Photovoltaic wafer manufacturing demands near-zero defects, yet anomaly detection models often fail to generalize across manufacturing lines due to domain shift caused by varying imaging devices and process conditions. This letter presents Projection Comparison and Reconstruction (PCR), a framework for cross-domain anomaly detection. Patch-based Domain Fusion mixes source and target images via grid-wise stochastic patch replacement, explicitly increasing cross-domain distribution overlap. Dual-Teacher Knowledge Distillation combines a frozen domain-agnostic teacher with a trainable adaptive teacher to obtain domain-invariant features for robust reconstruction. PCR achieves state-of-the-art performance, including an 8.07-point image-level AUROC gain on ELAD.
- 1 January 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Automation Science and Engineering
- Vol. 23, 15328-15342
FDDA: A Feature Disentangling Domain Adaptation Method for Robust Industrial Defect Detection
- 1 January 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Automation Science and Engineering
- Vol. 23, 15328-15342
FDDA: A Feature Disentangling Domain Adaptation Method for Robust Industrial Defect Detection
- 15 May 2025
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
- Vol. 38 (3) , 612-623
CPDD: A Cross-Scenario Photovoltaic Defect Detector Based on Fine-Grained Feature Autoencoding and Pseudo-Box Contrastive Learning
The vision foundation model, relying on large-scale pre-training, has advanced image comprehension capabilities and excels in general scenarios. However, its performance remains suboptimal in specialized tasks, such as photovoltaic (PV) cells defect detection. This limitation stems from the models’ lack of domain-specific prior knowledge. To address this, we propose a two-stage pre-training framework comprising fine-grained feature autoencoding (FFA) and pseudo-box contrastive learning (PCL), which leverages extensive unlabeled raw images to inject domain expertise into the model. First, we investigate the fine-grained feature autoencoder, which trains a detail-sensitive vision transformer (ViT) backbone by reconstructing the histogram of oriented gradients (HOG) of masked images. Second, we pre-train the detection head through contrastive learning. Using selective search (SS) to generate pseudo-boxes, we treat paired boxes from two augmented views of an image as positive samples. The abundant unsupervised pseudo-boxes optimize the detection head’s local representation and localization capabilities. Finally, we fully fine-tune the model with labeled images. Based on this methodology, we build the cross-scenario photovoltaic defect detector (CPDD). The experimental results demonstrate that CPDD achieves state-of-the-art (SOTA) mAP50 scores on three benchmarks, outperforming detectors pre-trained on the COCO dataset as well as those specifically designed for PV defect detection.
- 15 May 2025
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
- Vol. 38 (3) , 612-623
CPDD: A Cross-Scenario Photovoltaic Defect Detector Based on Fine-Grained Feature Autoencoding and Pseudo-Box Contrastive Learning
The vision foundation model, relying on large-scale pre-training, has advanced image comprehension capabilities and excels in general scenarios. However, its performance remains suboptimal in specialized tasks, such as photovoltaic (PV) cells defect detection. This limitation stems from the models’ lack of domain-specific prior knowledge. To address this, we propose a two-stage pre-training framework comprising fine-grained feature autoencoding (FFA) and pseudo-box contrastive learning (PCL), which leverages extensive unlabeled raw images to inject domain expertise into the model. First, we investigate the fine-grained feature autoencoder, which trains a detail-sensitive vision transformer (ViT) backbone by reconstructing the histogram of oriented gradients (HOG) of masked images. Second, we pre-train the detection head through contrastive learning. Using selective search (SS) to generate pseudo-boxes, we treat paired boxes from two augmented views of an image as positive samples. The abundant unsupervised pseudo-boxes optimize the detection head’s local representation and localization capabilities. Finally, we fully fine-tune the model with labeled images. Based on this methodology, we build the cross-scenario photovoltaic defect detector (CPDD). The experimental results demonstrate that CPDD achieves state-of-the-art (SOTA) mAP50 scores on three benchmarks, outperforming detectors pre-trained on the COCO dataset as well as those specifically designed for PV defect detection.
- Open Access
- 6 April 2021
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Access
- Vol. 9, 94970-94980
Insulator Anomaly Detection Method Based on Few-Shot Learning
Due to the advantages of safety and economy, it has become a trend to use unmanned aerial vehicles (UAVs) instead of humans to inspect high-voltage transmission lines. Considering the manual inspection process and the few-shot learning, a two-stage method for insulator anomaly detection is proposed. In the first stage, a positioning-restoration-cropping method is discussed for insulator string detection and processing. In the second stage, an insulator anomaly detection model called a multi-scale feature reweighting (MFR) network is built. With the help of few-shot object detection, the detection of five kinds of anomaly insulator caps, such as falling off, breakage and ablation is realized. The mean average precision (mAP) of the proposed method is 88.76%.
- 6 April 2021
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Access
- Vol. 9, 94970-94980
Open AccessInsulator Anomaly Detection Method Based on Few-Shot Learning
Due to the advantages of safety and economy, it has become a trend to use unmanned aerial vehicles (UAVs) instead of humans to inspect high-voltage transmission lines. Considering the manual inspection process and the few-shot learning, a two-stage method for insulator anomaly detection is proposed. In the first stage, a positioning-restoration-cropping method is discussed for insulator string detection and processing. In the second stage, an insulator anomaly detection model called a multi-scale feature reweighting (MFR) network is built. With the help of few-shot object detection, the detection of five kinds of anomaly insulator caps, such as falling off, breakage and ablation is realized. The mean average precision (mAP) of the proposed method is 88.76%.
- 22 November 2002
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 3, 1377-1380
Circuit based model for coupling between MMICs in multi-chip assemblies
- 22 November 2002
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 3, 1377-1380
Circuit based model for coupling between MMICs in multi-chip assemblies