SRSamantha G. Rosenberg

Samantha G. Rosenberg

*This is an algorithmically generated author record based on publicly available information.

Samantha G. Rosenberg has a total of 11 co-authors. Here are the top co-authors by number of shared publications:

  • Alexander C. Kozen

    American Society of Engineering Education 1 , 1818 N. Street N.W. Suite 600, Washington, DC 20036

    1 shared publication
  • Charles R. EddyJr.

    Power Electronics Materials, U.S. Naval Research Laboratory 8 , 4555 Overlook Ave., SW, Washington, DC 20375

    1 shared publication
  • Chris J. Palmstrøm

    Materials Department, University of California, Santa Barbara 2 , Santa Barbara, California 93106

    1 shared publication
  • Christa Wagenbach

    Department of Physics, Division of Materials Science and Engineering, Boston University 3 , 590 Commonwealth Ave., Boston, Massachusetts 02215

    1 shared publication
  • Daniel J. Pennachio

    Materials Department, University of California, Santa Barbara 2 , Santa Barbara, California 93106

    1 shared publication
  • Howie Joress

    Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA

    1 shared publication

Latest Publications

  • Low temperature surface preparation of GaN substrates for atomic layer epitaxial growth: Assessment of ex situ preparations

    by Samantha G. Rosenberg, Daniel J. Pennachio, Christa Wagenbach, Scooter D. Johnson, Neeraj Nepal, Alexander C. Kozen, Jeffrey M. Woodward, Zachary Robinson, Howie Joress, Karl F. Ludwig, et al.

    In situ and in vacuo surface studies of in situ and ex situ GaN substrate preparation were conducted to advance fundamental understanding of GaN surface preparation for low temperature atomic layer epitaxial growth. Grazing incidence small angle x-ray scattering (GISAXS) information is complemented with in vacuo x-ray photoelectron spectroscopy and ex situ atomic force microscopy studies to assess different ex situ sample preparation methods to produce the most suitable GaN surface for epitaxy. The authors have determined that a UV-ozone exposure followed by an HF dip produces the cleanest and smoothest GaN surface. They have further determined with GISAXS that subjecting the optimum surface to the established low temperature emulated gallium flash-off atomic level process (ALP) eliminates the need for any nitridation ALP. These ex situ and in situ cleaning preparations result in clean, highly-ordered surfaces that should provide an ideal substrate for high quality crystalline epitaxial films.