Jiayu Yin
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Jiayu Yin has a total of 5 co-authors. Here are the top co-authors by number of shared publications:
- Chengying Chen
School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China
2 shared publications - Jianhua Jiang
School of Electronics, Peking University, Beijing 100871, China
1 shared publication Wenli Liao
School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China
1 shared publication- Wenli Liao
School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China
1 shared publication - Yuyan Zhang
School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China
1 shared publication
Latest Publications
- Open Access
- 14 February 2023
- Published by Hindawi Limited in Active and Passive Electronic Components
- Vol. 2023, 1-11
A 0.9 V, 8T2R nvSRAM Memory Cell with High Density and Improved Storage/Restoration Time in 28 nm Technology Node
Combining with a static random-access memory (SRAM) and resistive memory (RRAM), an improved 8T2R nonvolatile SRAM (nvSRAM) memory cell is proposed in this study. With differential mode, a pair of 1T1R RRAM is added to 6T SRAM storage node. By optimizing the connection and layout scheme, the power consumption is reduced and the data stability is improved. The nvSRAM memory cell is realized with UMC CMOS 28nm 1p9m process. When the power supply voltage is 0.9V, the static noise/read/write margin is 0.35V, 0.16V, and 0.41V, respectively. The data storage/restoration time is 0.21ns and 0.18ns, respectively, with an active area of 0.97μm2.
- 14 February 2023
- Published by Hindawi Limited in Active and Passive Electronic Components
- Vol. 2023, 1-11
Open AccessA 0.9 V, 8T2R nvSRAM Memory Cell with High Density and Improved Storage/Restoration Time in 28 nm Technology Node
Combining with a static random-access memory (SRAM) and resistive memory (RRAM), an improved 8T2R nonvolatile SRAM (nvSRAM) memory cell is proposed in this study. With differential mode, a pair of 1T1R RRAM is added to 6T SRAM storage node. By optimizing the connection and layout scheme, the power consumption is reduced and the data stability is improved. The nvSRAM memory cell is realized with UMC CMOS 28nm 1p9m process. When the power supply voltage is 0.9V, the static noise/read/write margin is 0.35V, 0.16V, and 0.41V, respectively. The data storage/restoration time is 0.21ns and 0.18ns, respectively, with an active area of 0.97μm2.
- Open Access
- 30 December 2022
- Published by MDPI AG in Applied Sciences
- Vol. 13 (1) , 531
An 8kb RRAM-Based Nonvolatile SRAM with Pre-Decoding and Fast Storage/Restoration Time
Combining the advantages of low-power consumption of static random access memory (SRAM) with high stability and nonvolatile of resistive memory (RRAM), an improved 8T2R nonvolatile SRAM (nvSRAM) memory cell was proposed in this paper. In order to solve the problem that data cannot be stored when SRAM is powered off, RRAM technology was introduced into SRAM to realize an SRAM with nonvolatile function. The differential mode was adopted to improve the data restoration speed. Meanwhile, a pre-decoding technology was proposed to realize fast address decoding, and a voltage-mode sensitive amplifier was used to achieve fast amplification of two bit lines, so as to improve the reading speed of the memory. An 8kb nvSRAM was implemented with a CMOS 28 nm 1P9M process. The simulation results show that when the power supply voltage was 0.9 V, the static/read/write noise margin was 0.35 V, 0.16 V and 0.41 V, respectively. The data storage time was 0.21 ns, and restoration time was 0.18 ns. The time for the whole system to read 1 bit of data was 5.2 ns.
- 30 December 2022
- Published by MDPI AG in Applied Sciences
- Vol. 13 (1) , 531
Open AccessAn 8kb RRAM-Based Nonvolatile SRAM with Pre-Decoding and Fast Storage/Restoration Time
Combining the advantages of low-power consumption of static random access memory (SRAM) with high stability and nonvolatile of resistive memory (RRAM), an improved 8T2R nonvolatile SRAM (nvSRAM) memory cell was proposed in this paper. In order to solve the problem that data cannot be stored when SRAM is powered off, RRAM technology was introduced into SRAM to realize an SRAM with nonvolatile function. The differential mode was adopted to improve the data restoration speed. Meanwhile, a pre-decoding technology was proposed to realize fast address decoding, and a voltage-mode sensitive amplifier was used to achieve fast amplification of two bit lines, so as to improve the reading speed of the memory. An 8kb nvSRAM was implemented with a CMOS 28 nm 1P9M process. The simulation results show that when the power supply voltage was 0.9 V, the static/read/write noise margin was 0.35 V, 0.16 V and 0.41 V, respectively. The data storage time was 0.21 ns, and restoration time was 0.18 ns. The time for the whole system to read 1 bit of data was 5.2 ns.