Juergen W. Weber
Research Subjects
Juergen W. Weber has a total of 10 co-authors. Here are the top co-authors by number of shared publications:
Thorsten Trupke
2 shared publications- Ziv Hameiri
School of Photovoltaic and Renewable Energy Engineering University of New South Wales Sydney New South Wales Australia
2 shared publications - Arman Mahboubi Soufiani
Solar Energy Division, Helmholtz-Zentrum Berlin, Berlin, 12489, Germany
1 shared publication - Iskra Zafirovska
School of Photovoltaic and Renewable Energy Engineering University of New South Wales Kensington New South Wales Australia
1 shared publication - Johnson Wong
Griddler LLP, Singapore 763334, Singapore
1 shared publication - Matthias Klaus Juhl
School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW, Australia
1 shared publication
Latest Publications
- Open Access
- 8 March 2024
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 269
Simplified method for the conversion of luminescence signals from silicon wafers and solar cells into implied voltages
- 8 March 2024
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 269
Open AccessSimplified method for the conversion of luminescence signals from silicon wafers and solar cells into implied voltages
- Open Access
- 9 May 2023
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 257
Deep learning method for enhancing luminescence image resolution
- 9 May 2023
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 257
Open AccessDeep learning method for enhancing luminescence image resolution
- Open Access
- 25 August 2017
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Photovoltaics
- Vol. 7 (6) , 1496-1502
Detection of Finger Interruptions in Silicon Solar Cells Using Line Scan Photoluminescence Imaging
Finger interruptions or finger breaks are a common occurrence in screen printed solar cell manufacturing and may result in decreased performance due to an increase in effective series resistance. Identification of finger interruptions is typically accomplished using electroluminescence imaging. This paper demonstrates contactless detection of finger interruptions using line scan photoluminescence imaging. Modeling is used to highlight the difference between line scan photoluminescence images and conventional luminescence imaging methods. Significant benefits of using line scan photoluminescence imaging over electroluminescence imaging to identify finger interruptions are presented: in line scan photoluminescence images, finger interruptions cause an increase in luminescence intensity, while high recombination regions cause a decrease in intensity. This contrast inversion allows for a more unambiguous identification of defect types. Detailed modeling is performed to determine the impact of finger interruptions on line scan photoluminescence images, as a function of the location of the finger interruption and of illumination intensity. The increase in luminescence intensity from a finger interruption is found to correlate linearly with the corresponding power loss. Finally, experimental line scan photoluminescence images of industrial cells and full sized modules are presented and found to agree well with the modeling results.
- 25 August 2017
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Photovoltaics
- Vol. 7 (6) , 1496-1502
Open AccessDetection of Finger Interruptions in Silicon Solar Cells Using Line Scan Photoluminescence Imaging
Finger interruptions or finger breaks are a common occurrence in screen printed solar cell manufacturing and may result in decreased performance due to an increase in effective series resistance. Identification of finger interruptions is typically accomplished using electroluminescence imaging. This paper demonstrates contactless detection of finger interruptions using line scan photoluminescence imaging. Modeling is used to highlight the difference between line scan photoluminescence images and conventional luminescence imaging methods. Significant benefits of using line scan photoluminescence imaging over electroluminescence imaging to identify finger interruptions are presented: in line scan photoluminescence images, finger interruptions cause an increase in luminescence intensity, while high recombination regions cause a decrease in intensity. This contrast inversion allows for a more unambiguous identification of defect types. Detailed modeling is performed to determine the impact of finger interruptions on line scan photoluminescence images, as a function of the location of the finger interruption and of illumination intensity. The increase in luminescence intensity from a finger interruption is found to correlate linearly with the corresponding power loss. Finally, experimental line scan photoluminescence images of industrial cells and full sized modules are presented and found to agree well with the modeling results.