Betis Baheri

Despite progress in quantum research, there is a notable lack of development tools and technologies that assist developers in designing and analyzing quantum programs. This article aims to address this gap using a software engineering approach.

Quantum computing is one of the most promising technology advances of the latest years. Qubits are highly sensitive to noise, which can make the output useless. Lately, it has been shown that superconducting qubits are extremely susceptible to external sources of faults, such as ionizing radiation. When adopted in large scale, radiation-induced errors are expected to become a serious challenge for qubits reliability. We propose an evaluation of the impact of transient faults in the execution of quantum circuits on superconducting chips. Inspired by the Architectural and Program Vulnerability Factors, widely used for classical computation, we propose the Quantum Vulnerability Factor (QVF) to measure the impact of qubit corruption on the circuit output. We model faults, and design a fault injector, based on the latest studies on real machines and radiation experiments. We report the finding of more than 388,000,000 fault injections, considering single and double faults, on three algorithms, identifying the faults and qubits that are more likely to impact the output. We give guidelines on how to map the qubits in real devices to reduce the output error and to reduce the probability of having a radiation-induced corruption modifying the output. Finally, we compare simulations with experiments on physical quantum computers.

Quantum computing is a new computational paradigm, expected to revolutionize the computing field in the next few years. Qubits, the atomic units of a quantum circuit, exploit the quantum physics properties to increase the parallelism and speed of computation. Unfortunately, qubits are both intrinsically noisy and highly susceptible to external sources of faults, such as ionizing radiation. The latest discoveries highlight a much higher radiation sensitivity of qubits than traditional transistors and identify a much more complex fault model than bit-flip. The observed error rate is so high that researchers are questioning the large-scale adoption of quantum computers. The reliability and dependability community is asked to act to find innovative solutions to improve the reliability of quantum applications. This tutorial aims at providing the DSN community with the tools to do so and to train the attendees on quantum fault injection.