Lucas Sena
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Lucas Sena has a total of 10 co-authors. Here are the top co-authors by number of shared publications:
- João Pedro Santiago
Systems and Databases Laboratory, Federal University of Ceará
3 shared publications - Javam C. Machado
Universidade Federal do Ceará
2 shared publications - Joao Paulo Pordeus Gomes
Federal University of Ceará
2 shared publications - Lucas Cabral
Systems and Databases Laboratory, Federal University of Ceará
2 shared publications - Victor A. E. Farias
Federal University of Ceará (UFC)
2 shared publications - Diego Sá1 shared publication
Latest Publications
- Open Access
- 20 January 2026
- Published by Sociedade Brasileira de Computação in Journal of the Brazilian Computer Society
- Vol. 32 (1) , 1598-1617
Investigating the Impact of Image Quality Acquisition to Deep Object Detection Performance: a Case Study With PCB Damage Detection via Mobile Devices in the Wild
Mobile devices have revolutionized image acquisition, enabling diverse communication and image-processing applications. One promising application is automated damage detection in printed circuit boards (PCBs), crucial for quality control in electronics manufacturing. However, unlike controlled environments, mobile device image acquisition introduces challenges such as non-uniform lighting, background interference, and varying camera resolution, which can affect the accuracy of deep learning models. This paper presents a case study investigating the impact of domain-specific, no-reference image quality metrics on the performance of deep-learning object detection models for PCB damage detection. We evaluate nine metrics, including five novel contributions, using a semantic segmentation approach to measure foreground and background quality. Our study assesses how these metrics influence the performance of deep neural network architectures, determining optimal thresholds that separate high and low-quality images. Experiments are conducted on real-life images captured with smartphones in industrial settings. Our findings indicate that filtering poor-quality images based on these metrics could significantly improve detection performance, offering practical benefits for mobile damage detection applications.
- 20 January 2026
- Published by Sociedade Brasileira de Computação in Journal of the Brazilian Computer Society
- Vol. 32 (1) , 1598-1617
Open AccessInvestigating the Impact of Image Quality Acquisition to Deep Object Detection Performance: a Case Study With PCB Damage Detection via Mobile Devices in the Wild
Mobile devices have revolutionized image acquisition, enabling diverse communication and image-processing applications. One promising application is automated damage detection in printed circuit boards (PCBs), crucial for quality control in electronics manufacturing. However, unlike controlled environments, mobile device image acquisition introduces challenges such as non-uniform lighting, background interference, and varying camera resolution, which can affect the accuracy of deep learning models. This paper presents a case study investigating the impact of domain-specific, no-reference image quality metrics on the performance of deep-learning object detection models for PCB damage detection. We evaluate nine metrics, including five novel contributions, using a semantic segmentation approach to measure foreground and background quality. Our study assesses how these metrics influence the performance of deep neural network architectures, determining optimal thresholds that separate high and low-quality images. Experiments are conducted on real-life images captured with smartphones in industrial settings. Our findings indicate that filtering poor-quality images based on these metrics could significantly improve detection performance, offering practical benefits for mobile damage detection applications.
- 31 December 2024
- Published by Associacao Brasileira de Inteligencia Computacional - ABRICOM in Learning and Nonlinear Models
- Vol. 22 (1) , 17-31
Real-Time Detection of Customer-Induced Damage in Printed Circuit Boards Using Mobile Devices and YOLO Detectors
The identification of Consumer-induced damage is essential for electronics manufacturers’ warranty programs. Consumer Induced Damage (CID) is any damage caused by an unauthorized person, including the consumer. The product warranty does not cover these damages, avoiding expenses in the manufacturer’s revenue. The consumer-induced damage warranty process is usually done manually by technically trained people. However, this task demands a lot of attention to detail, can be time-consuming, and is susceptible to human errors. With this in mind, this work presents an object detection model for low-computational-cost devices that uses computer vision and deep learning methods with YOLO detectors embedded in mobile devices to identify consumer-induced damages on printed circuit boards (PCB). We conducted sixteen experiments with four YOLO neural network architectures and successfully developed a mobile application for CID detection. Our best model achieved a mAP@0.5 of 33.1% and an average of 5.7 FPS on real mobile devices.
- 31 December 2024
- Published by Associacao Brasileira de Inteligencia Computacional - ABRICOM in Learning and Nonlinear Models
- Vol. 22 (1) , 17-31
Real-Time Detection of Customer-Induced Damage in Printed Circuit Boards Using Mobile Devices and YOLO Detectors
The identification of Consumer-induced damage is essential for electronics manufacturers’ warranty programs. Consumer Induced Damage (CID) is any damage caused by an unauthorized person, including the consumer. The product warranty does not cover these damages, avoiding expenses in the manufacturer’s revenue. The consumer-induced damage warranty process is usually done manually by technically trained people. However, this task demands a lot of attention to detail, can be time-consuming, and is susceptible to human errors. With this in mind, this work presents an object detection model for low-computational-cost devices that uses computer vision and deep learning methods with YOLO detectors embedded in mobile devices to identify consumer-induced damages on printed circuit boards (PCB). We conducted sixteen experiments with four YOLO neural network architectures and successfully developed a mobile application for CID detection. Our best model achieved a mAP@0.5 of 33.1% and an average of 5.7 FPS on real mobile devices.
- 19 January 2024
- Published by Associacao Brasileira de Inteligencia Computacional - ABRICOM in Learning and Nonlinear Models
- Vol. 21 (2) , 29-42
An Active Learning Approach for Detecting Customer Induced Damages in Motherboards with Deep Neural Networks
Lucas Cabral , Victor Farias , Lucas Sena , Iago Chaves , João Paulo Pordeus , João Pedro Santiago , Diego Sá , Javam Machado ,& João Paulo Madeiro Identifying Customer Induced Damage (CID) is a key part in Read More ...
- 19 January 2024
- Published by Associacao Brasileira de Inteligencia Computacional - ABRICOM in Learning and Nonlinear Models
- Vol. 21 (2) , 29-42
An Active Learning Approach for Detecting Customer Induced Damages in Motherboards with Deep Neural Networks
Lucas Cabral , Victor Farias , Lucas Sena , Iago Chaves , João Paulo Pordeus , João Pedro Santiago , Diego Sá , Javam Machado ,& João Paulo Madeiro Identifying Customer Induced Damage (CID) is a key part in Read More ...