Boyang Hu

This research introduces a novel hybrid machine learning framework for automated quality prediction and classification of silicon solar modules in production lines. Unlike conventional approaches that rely solely on encapsulation loss rate (ELR) for performance evaluation—a method limited to assessing encapsulation-related power loss—our framework integrates unsupervised clustering and supervised classification to achieve a comprehensive analysis. By leveraging six critical performance parameters (open circuit voltage (V_OC), short circuit current (I_SC), maximum output power (P_max), voltage at maximum power point (VPM), current at maximum power point (IPM), and fill factor (FF)), we first employ k-means clustering to dynamically categorize modules into three performance classes: excellent performance (ELR: 0–0.77%), good performance (0.77–8.39%), and poor performance (>8.39%). This multidimensional clustering approach overcomes the narrow focus of traditional ELR-based methods by incorporating photoelectric conversion efficiency and electrical characteristics. Subsequently, five machine learning classifiers—decision trees (DT), random forest (RF), k-nearest neighbors (KNN), naive Bayes classifier (NBC), and support vector machines (SVMs)—are trained to classify modules, achieving 98.90% accuracy with RF demonstrating superior robustness. Pearson correlation analysis further identifies V_OC, P_max, and VPM as the most influential quality determinants, exhibiting strong negative correlations with ELR (−0.953, −0.993, −0.959). The proposed framework not only automates module quality assessment but also enhances production line efficiency by enabling real-time anomaly detection and yield optimization. This work represents a significant advancement in solar module evaluation, bridging the gap between data-driven automation and holistic performance analysis in photovoltaic manufacturing.