Akihira Munakata
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Akihira Munakata has a total of 6 co-authors. Here are the top co-authors by number of shared publications:
Kentaro Ema
Novel Crystal Technology, Inc., 2-3-1, Hirosedai, Sayama, Saitama, 350-1328, Japan
1 shared publication- Kohei Sasaki
Novel Crystal Technology, Inc. , Sayama, Saitama 350-1328
1 shared publication - Masaki Kobayashi
The University of Tokyo
1 shared publication - Takuya Maeda
Department of Electrical Engineering and Information Systems, The University of Tokyo 2 , Tokyo 113-8656
1 shared publication Yoshitaka Taniyasu
Basic Research Laboratories, NTT, Inc. 1 , Atsugi, Kanagawa 243-0198
1 shared publication- Yuki K. Wakabayashi
NTT Basic Research Laboratories
1 shared publication
Latest Publications
- Open Access
- 16 September 2025
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 138 (11)
Orbital-resolved anisotropic electron pockets in electron-doped SrTiO3 observed by ARPES
SrTiO3 (STO) has attracted considerable interest as a wide-bandgap semiconductor for advanced high-k capacitors and photocatalytic applications. Although previous angle-resolved photoemission spectroscopy (ARPES) studies have characterized the valence band structure originating from O 2p orbitals, the conduction band arising from Ti 3d orbitals upon electron doping, which is called electron pockets, remains poorly understood. In this study, polarization-dependent ARPES measurements were performed on Nb 1%-doped SrTiO3 (001), enabling the direct, orbital-selective visualization of the electron pockets. From the measured band dispersion, we quantitatively determined their effective masses, anisotropy, and electron density. Our results revealed the formation of an electron pocket at the Γ point induced by Nb doping, yielding a direct bandgap energy of 3.79 eV, consistent with previous optical measurements. Furthermore, the effective masses of m1 = 0.63m0 (short-axis direction) and m2 = 8.0m0 (long-axis direction) were identified, where m0 is the free electron mass, and the Fermi surface has been shown to be ellipsoidal. The electron density derived from these dispersions was found to be 3.58 × 1020 cm−3. These findings provide a comprehensive picture of the conduction-band electronic structure that will be crucial in the design of STO-based functional devices.
- 16 September 2025
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 138 (11)
Open AccessOrbital-resolved anisotropic electron pockets in electron-doped SrTiO3 observed by ARPES
SrTiO3 (STO) has attracted considerable interest as a wide-bandgap semiconductor for advanced high-k capacitors and photocatalytic applications. Although previous angle-resolved photoemission spectroscopy (ARPES) studies have characterized the valence band structure originating from O 2p orbitals, the conduction band arising from Ti 3d orbitals upon electron doping, which is called electron pockets, remains poorly understood. In this study, polarization-dependent ARPES measurements were performed on Nb 1%-doped SrTiO3 (001), enabling the direct, orbital-selective visualization of the electron pockets. From the measured band dispersion, we quantitatively determined their effective masses, anisotropy, and electron density. Our results revealed the formation of an electron pocket at the Γ point induced by Nb doping, yielding a direct bandgap energy of 3.79 eV, consistent with previous optical measurements. Furthermore, the effective masses of m1 = 0.63m0 (short-axis direction) and m2 = 8.0m0 (long-axis direction) were identified, where m0 is the free electron mass, and the Fermi surface has been shown to be ellipsoidal. The electron density derived from these dispersions was found to be 3.58 × 1020 cm−3. These findings provide a comprehensive picture of the conduction-band electronic structure that will be crucial in the design of STO-based functional devices.
- Open Access
- 23 June 2025
- Published by IOP Publishing in Applied Physics Express
- Vol. 18 (7)
Temperature dependence of barrier height in Ni/β-Ga2O3 Schottky barrier diode precisely determined by the analysis based on thermionic emission-diffusion model
Temperature dependence of barrier height in Ni/β-Ga2O3 Schottky barrier diode has been investigated in 303–573 K. The barrier height obtained by the capacitance-voltage (C-V) measurements slightly decreased with increasing temperature with the temperature coefficient of −0.51 meV/K. Since the electron mobility in β-Ga2O3 is not high, the thermionic emission-diffusion (TED) model was used for the analysis of the current-voltage (I-V) measurements. The consistent temperature coefficient of −0.49±0.02 meV/K were obtained from the C-V and I-V measurements, suggesting that the origin of the temperature dependence of the barrier height of Ni/β-Ga2O3 stems from lowering of the conduction band minimum.
- 23 June 2025
- Published by IOP Publishing in Applied Physics Express
- Vol. 18 (7)
Open AccessTemperature dependence of barrier height in Ni/β-Ga2O3 Schottky barrier diode precisely determined by the analysis based on thermionic emission-diffusion model
Temperature dependence of barrier height in Ni/β-Ga2O3 Schottky barrier diode has been investigated in 303–573 K. The barrier height obtained by the capacitance-voltage (C-V) measurements slightly decreased with increasing temperature with the temperature coefficient of −0.51 meV/K. Since the electron mobility in β-Ga2O3 is not high, the thermionic emission-diffusion (TED) model was used for the analysis of the current-voltage (I-V) measurements. The consistent temperature coefficient of −0.49±0.02 meV/K were obtained from the C-V and I-V measurements, suggesting that the origin of the temperature dependence of the barrier height of Ni/β-Ga2O3 stems from lowering of the conduction band minimum.