WZWei Zhang

Wei Zhang

*This is an algorithmically generated author record based on publicly available information.

Wei Zhang has a total of 5 co-authors. Here are the top co-authors by number of shared publications:


Latest Publications

  • Open Access

    Genesis Mechanism and Logging Evaluation Methods for Low-Resistivity Contrast Gas-Bearing Layers in Shallow Gas Reservoirs

    by Ruijie Huang, Liang Xiao, Wei Zhang, Ruize Shi, Xiaopeng Liu, Ning Wu

    Shallow gas reservoirs exhibit low formation pressure and gas injection levels, leading to low-resistivity contrast between gas-bearing reservoirs and fully water-saturated layers. Gas-bearing formation identification and water saturation estimation face great challenges. To improve the accuracy of shallow gas reservoir identification and logging evaluation, it is essential to analyze the genesis mechanisms underlying the low-resistivity contrast. This study used the HJ Formation, a typical shallow gas reservoir located in the BY Sag of the eastern South China Sea Basin as an example. Combining the results of nuclear magnetic resonance (NMR), full rock mineral analysis and X-ray diffraction of clay minerals in the laboratory, it was determined that the genesis mechanism for the low-resistivity contrast in the gas-bearing reservoir was due to the high irreducible water saturation (Swi) and the cation-induced supplementary conductivity. Afterwards, we integrated three methods, density–neutron correlation, calculation of the apparent formation water resistivity, and cross-plots of conventional and gas-logging curves, to identify shallow gas reservoirs. In addition, we also established a Waxman–Smits-based model to estimate water saturation. Compared with the typical Archie’s equation, the predicted water saturation curve using the Waxman–Smits-based model was more reasonable. The established methods and models can be used in target shallow gas reservoir evaluations, and it also has reference value for other types of oilfields with similar physical characteristics.