Cecilia Bruschi
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Cecilia Bruschi has a total of 6 co-authors. Here are the top co-authors by number of shared publications:
Asaminew Yerango Shimolo
Laboratory of Organic Electronics, Department of Science and Technology, Linköping University, Bredgatan 33, 60221, Sweden
1 shared publicationJohanna Heimonen
Laboratory of Organic Electronics, Department of Science and Technology, Linköping University, Bredgatan 33, 60221, Sweden
1 shared publicationMats Fahlman
Laboratory of Organic Electronics, Department of Science and Technology, Linköping University, Bredgatan 33, 60221, Sweden
1 shared publication- Mikhail Vagin
Laboratory of Organic Electronics Department of Science and Technology Linköping University Norrköping Sweden
1 shared publication Qilun Zhang
Department of Materials Science and Engineering, Stanford University, 496 Lomita Mall, Stanford, CA 94305, USA
1 shared publication- Renee Kroon
Laboratory of Organic Electronics Department of Science and Technology Linköping University Norrköping SE‐601 74 Sweden
1 shared publication
Latest Publications
- Open Access
- 5 November 2025
- Published by Royal Society of Chemistry (RSC) in Journal of Materials Chemistry A
- Vol. 14 (1) , 337-342
Autonomous aqueous H 2 O 2 production with a carboxylate-functionalized polythiophene
A functionalized polythiophene autonomously produced ∼1 × 10 −4 mol H 2 O 2 per g polymer (18% doping level) in aqueous O 2 solutions via ORR. This work opens new applications driven by this process and elucidates degradation mechanisms in OE devices.
- 5 November 2025
- Published by Royal Society of Chemistry (RSC) in Journal of Materials Chemistry A
- Vol. 14 (1) , 337-342
Open AccessAutonomous aqueous H 2 O 2 production with a carboxylate-functionalized polythiophene
A functionalized polythiophene autonomously produced ∼1 × 10 −4 mol H 2 O 2 per g polymer (18% doping level) in aqueous O 2 solutions via ORR. This work opens new applications driven by this process and elucidates degradation mechanisms in OE devices.