Huawei Liu
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Previous Organizations / Institutes
The organizations / institutes from the scholar's other articles in the past ten years
Research Subjects
Huawei Liu has a total of 47 co-authors. Here are the top co-authors by number of shared publications:
- Anlian Pan
School of Physics and Electronics, Hunan Normal University, Changsha, China
7 shared publications Xiaoli Zhu
Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, State Key Laboratory of Chemo/Biosensing and Chemometrics, State Key Laboratory of Advanced Design and Manufacturing Technology for Vehicle, Hunan Institute of Optoelectronic Integration, College of Materials Science and Engineering, Hunan University, Changsha, 410082, China
6 shared publications- Dong Li
Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, Hunan Institute of Optoelectronic Integration, College of Materials Science and Engineering, Hunan University, Changsha, China
5 shared publications Chenguang Zhu
Key Laboratory for Micro‐Nano Physics and Technology of Hunan Province State Key Laboratory of Chemo/Biosensing and Chemometrics College of Materials Science and Engineering Hunan University Changsha Hunan 410082 China
4 shared publicationsXingxia Sun
Key Laboratory for Micro‐Nano Physics and Technology of Hunan Province State Key Laboratory of Chemo/Biosensing and Chemometrics College of Materials Science and Engineering Hunan University Changsha Hunan 410082 China
4 shared publicationsBiyuan Zheng
Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, State Key Laboratory of Chemo/Biosensing and Chemometrics, College of Materials Science and Engineering, Hunan University, Changsha, China
3 shared publications
Latest Publications
- 4 May 2026
- Published by Royal Society of Chemistry (RSC) in Nanoscale
- Vol. 18 (23) , 12355-12363
Near-infrared photovoltaic gating enables polarity-reconfigurable WSe 2 phototransistors for in-sensor computing
A substrate-engineered WSe 2 /HfO 2 /Si PN phototransistor enables programmable positive, negative, and zero photoconductance under near-infrared light for reconfigurable in-sensor neuromorphic computing.
- 4 May 2026
- Published by Royal Society of Chemistry (RSC) in Nanoscale
- Vol. 18 (23) , 12355-12363
Near-infrared photovoltaic gating enables polarity-reconfigurable WSe 2 phototransistors for in-sensor computing
A substrate-engineered WSe 2 /HfO 2 /Si PN phototransistor enables programmable positive, negative, and zero photoconductance under near-infrared light for reconfigurable in-sensor neuromorphic computing.
- 28 February 2026
- Published by Wiley in Advanced Materials
- Vol. 38 (18)
Direct Growth of Wafer‐Scale 2D Semiconductor Transistors via One‐Step PtTe 2 /2H‐MoTe 2 Heterophase Formation
2D semiconductors offer a promising platform for next‐generation integrated circuits and large‐scale electronic systems. Realizing high‐performance p‐type transistors, however, remains challenging due to Fermi‐level pinning, high contact resistance, and poorly defined interfaces in conventional stepwise fabrication. Here, we demonstrate a single‐step tellurization growth strategy that simultaneously forms PtTe 2 contacts on 2H‐MoTe 2 channels to directly realize 2D semiconductor transistors. This approach forms PtTe 2 /2H‐MoTe 2 metal/semiconductor arrays with precise control of the MoTe 2 phase at the PtTe 2 electrode interface, while providing integrated van der Waals metallic contacts without the need for post‐growth of metal contacts. Using this method, we achieve wafer‐scale heterophase arrays characterized by uniform patterning and well‐controlled 2H/1T' phase transformation dynamics. The heterojunctions display sharp and clean interfaces, as verified by TEM, STEM, and EDS mapping. Transistor arrays fabricated from these heterophase structures show Ohmic contacts with low Schottky barrier heights, delivering on/off ratios up to 5 × 10 4 and consistent mobility of 5–9 cm 2 /Vs across 100 devices, ensuring efficient carrier injection. Our results establish a scalable pathway for the direct growth of 2D semiconductor transistors, overcoming conventional multi‐step device fabrication bottlenecks and providing a promising platform for large‐scale, and reproducible 2D electronics.
- 28 February 2026
- Published by Wiley in Advanced Materials
- Vol. 38 (18)
Direct Growth of Wafer‐Scale 2D Semiconductor Transistors via One‐Step PtTe 2 /2H‐MoTe 2 Heterophase Formation
2D semiconductors offer a promising platform for next‐generation integrated circuits and large‐scale electronic systems. Realizing high‐performance p‐type transistors, however, remains challenging due to Fermi‐level pinning, high contact resistance, and poorly defined interfaces in conventional stepwise fabrication. Here, we demonstrate a single‐step tellurization growth strategy that simultaneously forms PtTe 2 contacts on 2H‐MoTe 2 channels to directly realize 2D semiconductor transistors. This approach forms PtTe 2 /2H‐MoTe 2 metal/semiconductor arrays with precise control of the MoTe 2 phase at the PtTe 2 electrode interface, while providing integrated van der Waals metallic contacts without the need for post‐growth of metal contacts. Using this method, we achieve wafer‐scale heterophase arrays characterized by uniform patterning and well‐controlled 2H/1T' phase transformation dynamics. The heterojunctions display sharp and clean interfaces, as verified by TEM, STEM, and EDS mapping. Transistor arrays fabricated from these heterophase structures show Ohmic contacts with low Schottky barrier heights, delivering on/off ratios up to 5 × 10 4 and consistent mobility of 5–9 cm 2 /Vs across 100 devices, ensuring efficient carrier injection. Our results establish a scalable pathway for the direct growth of 2D semiconductor transistors, overcoming conventional multi‐step device fabrication bottlenecks and providing a promising platform for large‐scale, and reproducible 2D electronics.
- 27 December 2023
- Published by Wiley in Advanced Functional Materials
- Vol. 34 (17)
Polarization‐Sensitive Photodetectors Based on Highly In‐Plane Anisotropic Violet Phosphorus with Large Dichroic Ratio
Anisotropic 2D layered materials with distinctive anisotropic electronic band structures and optical response are promising for practical applications in polarization imaging and sensors. Nonetheless, many of the currently reported polarized photodetectors based on anisotropic 2D materials are constrained by the low polarization responsivity and low linear dichroism ratio. Here a high‐performance polarization‐sensitive photodetector based on the novel in‐plane anisotropy 2D violet phosphorus (VP) crystal is reported. The angle‐resolved polarized Raman spectroscopy (ARPRS) study and the anisotropic electrical transport measurements revealed the highly in‐plane anisotropy phonon vibration and electrical properties of VP crystal. The anisotropic ratio of electron mobility is calculated to be 2.7 at room temperature. Moreover, a polarization‐sensitive photodetector based on the VP nanosheet shows high photoresponsivity of up to 341 A W−1 and a linearly dichroic ratio of up to 3.9, which is much larger than most other anisotropic 2D materials. These results indicate that the anisotropic VP crystal would be suitable for polarization‐sensitive photodetectors, which leads to a promising perspective for future novel electronic and optoelectronic devices.
- 27 December 2023
- Published by Wiley in Advanced Functional Materials
- Vol. 34 (17)
Polarization‐Sensitive Photodetectors Based on Highly In‐Plane Anisotropic Violet Phosphorus with Large Dichroic Ratio
Anisotropic 2D layered materials with distinctive anisotropic electronic band structures and optical response are promising for practical applications in polarization imaging and sensors. Nonetheless, many of the currently reported polarized photodetectors based on anisotropic 2D materials are constrained by the low polarization responsivity and low linear dichroism ratio. Here a high‐performance polarization‐sensitive photodetector based on the novel in‐plane anisotropy 2D violet phosphorus (VP) crystal is reported. The angle‐resolved polarized Raman spectroscopy (ARPRS) study and the anisotropic electrical transport measurements revealed the highly in‐plane anisotropy phonon vibration and electrical properties of VP crystal. The anisotropic ratio of electron mobility is calculated to be 2.7 at room temperature. Moreover, a polarization‐sensitive photodetector based on the VP nanosheet shows high photoresponsivity of up to 341 A W−1 and a linearly dichroic ratio of up to 3.9, which is much larger than most other anisotropic 2D materials. These results indicate that the anisotropic VP crystal would be suitable for polarization‐sensitive photodetectors, which leads to a promising perspective for future novel electronic and optoelectronic devices.
- 5 December 2022
- Published by Tsinghua University Press in Nano Research
- Vol. 16 (9) , 11832-11838
Epitaxial van der Waals contacts for low schottky barrier MoS2 field effect transistors
Small contact resistance and low Schottky barrier height (SBH) are the keys to energy-efficient electronics and optoelectronics. Two-dimensional (2D) semiconductors-based field effect transistors (FETs), holding great promise for next-generation information circuits, still suffer from poor contact quality at the metal—semiconductor junction interface, which severely hinders their further applications. Here, a novel contact strategy is proposed, where Bi2Te3 nanosheets with high conductivity were in-situ epitaxially grown on MoS2 as van der Waals contacts, which can effectively avoid the damage to MoS2 caused during the device manufacturing process, leading to a high-performance MoS2 FET. Moreover, the small work function difference between Bi2Te3 and MoS2 (Bi2Te3: 4.31 eV, MoS2: 4.37 eV, measured by Kelvin probe force microscopy (KPFM)), enables small band bending and Ohmic contact at the junction interface. Electrical characterizations indicate that the MoS2 FET device with Bi2Te3 contacts possesses a high current on/off ratio (5 × 107), large effective carrier mobility (90 cm2/(V·s)), and low flat-band SBH (60 meV), which is favorable as compared with MoS2 FET with traditional Cr/Au electrodes contacts, and superior to the vast majority of the reported chemical vapor deposition (CVD) MoS2-based FET device. The demonstration of epitaxial van der Waals Bi2Te3 contacts will facilitate the application of 2D MoS2 nanosheet in next-generation low-power consumption electronics and optoelectronics.
- 5 December 2022
- Published by Tsinghua University Press in Nano Research
- Vol. 16 (9) , 11832-11838
Epitaxial van der Waals contacts for low schottky barrier MoS2 field effect transistors
Small contact resistance and low Schottky barrier height (SBH) are the keys to energy-efficient electronics and optoelectronics. Two-dimensional (2D) semiconductors-based field effect transistors (FETs), holding great promise for next-generation information circuits, still suffer from poor contact quality at the metal—semiconductor junction interface, which severely hinders their further applications. Here, a novel contact strategy is proposed, where Bi2Te3 nanosheets with high conductivity were in-situ epitaxially grown on MoS2 as van der Waals contacts, which can effectively avoid the damage to MoS2 caused during the device manufacturing process, leading to a high-performance MoS2 FET. Moreover, the small work function difference between Bi2Te3 and MoS2 (Bi2Te3: 4.31 eV, MoS2: 4.37 eV, measured by Kelvin probe force microscopy (KPFM)), enables small band bending and Ohmic contact at the junction interface. Electrical characterizations indicate that the MoS2 FET device with Bi2Te3 contacts possesses a high current on/off ratio (5 × 107), large effective carrier mobility (90 cm2/(V·s)), and low flat-band SBH (60 meV), which is favorable as compared with MoS2 FET with traditional Cr/Au electrodes contacts, and superior to the vast majority of the reported chemical vapor deposition (CVD) MoS2-based FET device. The demonstration of epitaxial van der Waals Bi2Te3 contacts will facilitate the application of 2D MoS2 nanosheet in next-generation low-power consumption electronics and optoelectronics.
- 7 November 2019
- Published by American Chemical Society (ACS) in ACS Nano
- Vol. 13 (11) , 13573-13580
Self-Powered Broad-band Photodetectors Based on Vertically Stacked WSe2/Bi2Te3 p–n Heterojunctions
Semiconducting p-n heterojunctions, serving as the basic unit of modern electronic devices, such as photodetectors, solar-energy conversion devices, and light-emitting diodes (LEDs), have been extensively investigated in recent years. In this work, high performance self-powered broadband photodetectors were fabricated based on vertically stacked p-n heterojunctions though combining p-type WSe2 with n-type Bi2Te3 via van der Waals (vdW) epitaxial growth. Devices based on the p-n heterojunction show obvious current rectification behaviors in the dark and superior photovoltaic characteristics under light irradiation. Maximum short circuit current of 18 nA and open circuit voltage of 0.25 V can be achieved with the illumination light of 633 nm (power density: 26.4 mW/cm2), which are among the highest values compared with the ever reported 2D vdW heterojunctions synthesized by CVD method. Benefiting from the broadband absorption of the heterostructures, the detection range can be expanded from visible to near-infrared (375-1550 nm). Moreover, ascribing to the efficient carriers separation process at the junction interfaces, the devices can be further employed as self-powered photodetectors, where fast response time (≈210 μs) and high responsivity (20.5 A/W at 633 nm and 27 mA/W at 1550 nm) are obtained under zero bias voltage. The WSe2/Bi2Te3 p-n heterojunction-based self-powered photodetectors with high photoresponsivity, fast photoresponse time and broad spectral response will find potential applications in high speed and self-sufficient broadband devices.
- 7 November 2019
- Published by American Chemical Society (ACS) in ACS Nano
- Vol. 13 (11) , 13573-13580
Self-Powered Broad-band Photodetectors Based on Vertically Stacked WSe2/Bi2Te3 p–n Heterojunctions
Semiconducting p-n heterojunctions, serving as the basic unit of modern electronic devices, such as photodetectors, solar-energy conversion devices, and light-emitting diodes (LEDs), have been extensively investigated in recent years. In this work, high performance self-powered broadband photodetectors were fabricated based on vertically stacked p-n heterojunctions though combining p-type WSe2 with n-type Bi2Te3 via van der Waals (vdW) epitaxial growth. Devices based on the p-n heterojunction show obvious current rectification behaviors in the dark and superior photovoltaic characteristics under light irradiation. Maximum short circuit current of 18 nA and open circuit voltage of 0.25 V can be achieved with the illumination light of 633 nm (power density: 26.4 mW/cm2), which are among the highest values compared with the ever reported 2D vdW heterojunctions synthesized by CVD method. Benefiting from the broadband absorption of the heterostructures, the detection range can be expanded from visible to near-infrared (375-1550 nm). Moreover, ascribing to the efficient carriers separation process at the junction interfaces, the devices can be further employed as self-powered photodetectors, where fast response time (≈210 μs) and high responsivity (20.5 A/W at 633 nm and 27 mA/W at 1550 nm) are obtained under zero bias voltage. The WSe2/Bi2Te3 p-n heterojunction-based self-powered photodetectors with high photoresponsivity, fast photoresponse time and broad spectral response will find potential applications in high speed and self-sufficient broadband devices.
- 1 May 2019
- Published by Elsevier in Nano Energy
- Vol. 59, 66-74
Van der Waals epitaxial growth of vertically stacked Sb2Te3/MoS2 p–n heterojunctions for high performance optoelectronics
- 1 May 2019
- Published by Elsevier in Nano Energy
- Vol. 59, 66-74
Van der Waals epitaxial growth of vertically stacked Sb2Te3/MoS2 p–n heterojunctions for high performance optoelectronics
- 9 April 2019
- Published by American Chemical Society (ACS) in ACS Applied Materials & Interfaces
- Vol. 11 (17) , 15813-15820
Polar-Induced Selective Epitaxial Growth of Multijunction Nanoribbons for High-Performance Optoelectronics
Semiconductor heterostructures are basic building blocks for modern electronics and optoelectronics. However, it still remains a great challenge to combine different semiconductor materials in single nanostructures with tailored geometry and chemical composition. Here, a polar-induced selective epitaxial growth method is reported to alternately grow CdS and CdSxSe1-x heterostructure nanoribbons (NRs) side by side in the lateral direction, with the heterointerface (junction) number to be well controlled. Transmission electron microscopy (TEM) and spatial-resolved µ-PL spectra are employed to characterize the heterostructure NRs, which indicate that the achieved NRs are high quality heterostructures with sharp interfaces. Kelvin probe force microscopy (KPFM) and femtosecond pump-probe characterizations further confirm the efficient charge transfer process across the interfaces in the multi-junction NRs. Photodetectors based on the achieved NRs are realized and systematically investigated, demonstrating junction-number-dependent optoelectronic response behaviors. NRs with more junctions exhibit more superior device performances, reflecting the important roles of the high-quality interface regions. Based on this multi-junction NRs device, high on-off ratio (107) and remarkable responsivity (1.5×105 A/W) are demonstrated, both of which represent the best compared to the ever reported CdS, CdSe and their heterostructures. These novel multi-junction NRs may find broad applications in future integrated photonics and optoelectronics devices and systems.
- 9 April 2019
- Published by American Chemical Society (ACS) in ACS Applied Materials & Interfaces
- Vol. 11 (17) , 15813-15820
Polar-Induced Selective Epitaxial Growth of Multijunction Nanoribbons for High-Performance Optoelectronics
Semiconductor heterostructures are basic building blocks for modern electronics and optoelectronics. However, it still remains a great challenge to combine different semiconductor materials in single nanostructures with tailored geometry and chemical composition. Here, a polar-induced selective epitaxial growth method is reported to alternately grow CdS and CdSxSe1-x heterostructure nanoribbons (NRs) side by side in the lateral direction, with the heterointerface (junction) number to be well controlled. Transmission electron microscopy (TEM) and spatial-resolved µ-PL spectra are employed to characterize the heterostructure NRs, which indicate that the achieved NRs are high quality heterostructures with sharp interfaces. Kelvin probe force microscopy (KPFM) and femtosecond pump-probe characterizations further confirm the efficient charge transfer process across the interfaces in the multi-junction NRs. Photodetectors based on the achieved NRs are realized and systematically investigated, demonstrating junction-number-dependent optoelectronic response behaviors. NRs with more junctions exhibit more superior device performances, reflecting the important roles of the high-quality interface regions. Based on this multi-junction NRs device, high on-off ratio (107) and remarkable responsivity (1.5×105 A/W) are demonstrated, both of which represent the best compared to the ever reported CdS, CdSe and their heterostructures. These novel multi-junction NRs may find broad applications in future integrated photonics and optoelectronics devices and systems.