A scattering spectrometer for white light interferometry
Authors:
- Qi SunQSQi Sun
- James WilliamsonJWJames Williamson
- Tom VettenburgTVTom Vettenburg
- David B. PhillipsDPDavid B. Phillips
- Haydn MartinHMHaydn Martin
- Gilberto BrambillaGBGilberto Brambilla
- Xiangqian JiangXJXiangqian Jiang
- Martynas BeresnaMBMartynas Beresna
Open Access
- 21 July 2023
- journal article
- research article
- Published by Elsevier in Optics and Lasers in Engineering
- Vol. 169
Abstract
No abstract availableKeywords
Funding Information
- European Research Council (804626)
- UK Research and Innovation (MR/S034900/1)
- Engineering and Physical Sciences Research Council (EP/N00762X/1, EP/P006930/1)
- Royal Academy of Engineering
- European Research Council
This publication has 15 references indexed in Scilit:
- Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisitionOptics Express, 2016
- High resolution position measurement from dispersed reference interferometry using template matchingOptics Express, 2016
- An Experimental Method for Determination of the Refractive Index of Liquid Samples Using Michelson InterferometerActa Physica Polonica A, 2016
- High-resolution and broadband all-fiber spectrometersOptica, 2014
- Random super-prism wavelength meterOptics Letters, 2013
- Compact spectrometer based on a disordered photonic chipNature Photonics, 2013
- An extrinsic Fabry–Perot interferometer-based large strain sensor with high resolutionMeasurement Science and Technology, 2010
- Fiber-optical sensor with miniaturized probe head and nanometer accuracy based on spatially modulated low-coherence interferogram analysisApplied Optics, 2007
- White-light interferometer with dispersion: an accurate fiber-optic sensor for the measurement of distanceApplied Optics, 2005
- Three-dimensional optical storage inside transparent materialsOptics Letters, 1996