Benchmarking Complex Permittivity Measurements
Authors:
- Lucas L. EnrightLELucas L. Enright
- Benjamin F. JamrozBJBenjamin F. Jamroz
- Charles HillCHCharles Hill
- Marzena Olszewska-PlachaMOMarzena Olszewska-Placha
- Bryan T. BosworthBBBryan T. Bosworth
- Nicholas R. JungwirthNJNicholas R. Jungwirth
- Say PhommakesoneSPSay Phommakesone
- Daisuke KatoDKDaisuke Kato
- Hanna KahariHKHanna Kahari
- Chiawen LeeCLChiawen Lee
- Chang-Sheng ChenCCChang-Sheng Chen
- Bartlomiej SalskiBSBartlomiej Salski
- 1 January 2026
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 75, 6005315
Abstract
No abstract availableFunding Information
- National Institute of Standards and Technology and the “Creating Helpful Incentives to Produce Semiconductors” for America Act (24YL1900600)
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