A two-step in situ measurement method for temperature and thermal stress of power device based on a single Raman peak
- 2 August 2023
- journal article
- research article
- Published by Elsevier in International Journal of Heat and Mass Transfer
- Vol. 216
Abstract
No abstract availableKeywords
Funding Information
- National Natural Science Foundation of China (51827807, 52130602, 52206097)
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